Characterization of ultrathin sputtered SiO films on alumina by inelastic electron tunneling spectroscopy and atomic force microscopy
1992 ◽
Vol 10
(4)
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pp. 2412-2418
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2010 ◽
Vol 83
(6)
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pp. 249-255
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1992 ◽
Vol 59
(3-4)
◽
pp. 219-226
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1993 ◽
Vol 113
(11)
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pp. 785-790
1992 ◽
Vol 96
(4)
◽
pp. 1848-1854
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2008 ◽
Vol 254
(13)
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pp. 3829-3838
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1991 ◽
Vol 51
(1-2)
◽
pp. 61-69
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