Characterization of ultrathin sputtered SiO films on alumina by inelastic electron tunneling spectroscopy and atomic force microscopy

1992 ◽  
Vol 10 (4) ◽  
pp. 2412-2418 ◽  
Author(s):  
R. R. Mallik ◽  
P. N. Henriksen ◽  
T. Butler ◽  
W. J. Kulnis ◽  
T. Confer
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