Improving 355nm laser damage resistance for fluoride mirrors with overcoat layer

2017 ◽  
Author(s):  
Zhen Yu ◽  
Hongji Qi ◽  
Weili Zhang ◽  
Hu Wang ◽  
Bin Wang
2004 ◽  
Author(s):  
Leonid B. Glebov ◽  
Larissa N. Glebova ◽  
Vadim I. Smirnov ◽  
Mark Dubinskii ◽  
Larry D. Merkle ◽  
...  

2013 ◽  
Vol 52 (7) ◽  
pp. 1368 ◽  
Author(s):  
Mathias Mende ◽  
Stefan Schrameyer ◽  
Henrik Ehlers ◽  
Detlev Ristau ◽  
Laurent Gallais

2008 ◽  
Author(s):  
J. B. Oliver ◽  
S. Papernov ◽  
A. W. Schmid ◽  
J. C. Lambropoulos

Author(s):  
Guohang Hu ◽  
Yueliang Wang ◽  
Junxiu Chang ◽  
Xiaoyi Xie ◽  
Yuanan Zhao ◽  
...  

Rapid growth processing of KDP crystals was improved by employing continuous filtration to eliminate bulk defects. The performances of the KDP crystals, including scattering defects, laser damage resistance and transmittance, were measured and analyzed. Compared with rapid-grown KDP without continuous filtration, the transmittance in the near-infrared was increased by at least 2%, almost all of ‘micron size’ defects were eliminated and ‘sub-micron size’ defects were decreased by approximately 90%. Laser damage testing revealed that the laser-induced damage thresholds (LIDTs), as well as the consistency of the LIDTs from sample to sample, were improved greatly. Moreover, it identified that ‘micron size’ defects were the precursors which initiated laser damage at relative lower laser fluence (4–6 J cm−2), and there was a lower correlation between smaller size scattering defects and laser damage initiation. The improved consistency in the LIDTs, attributed to elimination of ‘micron size’ defects, and LIDT enhancement originated from the decreased absorption of the KDP crystals.


2014 ◽  
Vol 53 (4) ◽  
pp. A383 ◽  
Author(s):  
Mathias Mende ◽  
Istvan Balasa ◽  
Henrik Ehlers ◽  
Detlev Ristau ◽  
Dam-be Douti ◽  
...  

2020 ◽  
Vol 10 (4) ◽  
pp. 937 ◽  
Author(s):  
Colin Harthcock ◽  
S. Roger Qiu ◽  
Paul B. Mirkarimi ◽  
Raluca A. Negres ◽  
Gabe Guss ◽  
...  

2021 ◽  
Author(s):  
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Kyle R. P. Kafka ◽  
Nathaniel D. Urban ◽  
Jason U. Wallace ◽  
Stavros G. Demos

2020 ◽  
Vol 59 (05) ◽  
pp. 1
Author(s):  
Praveen K. Velpula ◽  
Daniel Kramer ◽  
Michal Ďurák ◽  
Bedřich Rus

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