Ghost reflection of testing long focal length lens with computer-generated hologram

Author(s):  
Jian-Peng Cui ◽  
Ning Zhang ◽  
Jie Liu ◽  
Ding-Yao Yan ◽  
Ping Ma ◽  
...  
2021 ◽  
Author(s):  
Jian-Peng Cui ◽  
Zhi-Gang Li ◽  
Zhen-Jun Bao ◽  
Heng Zhao ◽  
Ning Zhang ◽  
...  

2019 ◽  
Vol 215 ◽  
pp. 04004
Author(s):  
Jian-Peng Cui ◽  
Ning Zhang ◽  
Jie Liu ◽  
Di-Long Wu ◽  
Hua Xu ◽  
...  

A method for testing the transmitted wavefront of large aperture long-focal-length lens with a multizone computer-generated hologram (CGH) is proposed. The multizone CGH has 5 zones: one main zone for the null testing of long-focal-length lens and four auxiliary zones for the pre-alignment of measured lens. Both 1st order wavefront and 0th order wavefront of CGH are measured, and 0th order wavefront is used to calibrate the substrate error. To verify this test approach, a 450mm×450mm multizone CGH is designed and fabricated for testing the spatial filter lens. Experiments and error analysis are carried out. The results show that the desired precision can be reached with use of CGH.


2018 ◽  
Vol 26 (21) ◽  
pp. 28067 ◽  
Author(s):  
Jian-Peng Cui ◽  
Ning Zhang ◽  
Jie Liu ◽  
Di-Long Wu ◽  
Hua Xu ◽  
...  

2018 ◽  
Vol 26 (11) ◽  
pp. 14741 ◽  
Author(s):  
Tigran Baghdasaryan ◽  
Thomas Geernart ◽  
Adriana Morana ◽  
Emmanuel Marin ◽  
Sylvain Girard ◽  
...  

1996 ◽  
Vol 13 (2) ◽  
pp. 257 ◽  
Author(s):  
Qiming Li ◽  
K. G. H. Baldwin ◽  
H.-A. Bachor ◽  
D. E. McClelland

Author(s):  
A. V. Crewe

A 100 kv transmission scanning microscope is now being constructed which should have a point resolution of 2.5 to 3 Å. The design of this microscope is similar to the design of our existing 30 kv 5 Å microscope, but there are several significant changes which are based upon some difficulties and sources of inflexibility of that microscope.A field emission electron gun of our usual design will be used as the source of electrons, the only difference being that the spacing between the anodes has been increased from 2 to 3 cm. The electron beam will then pass through a condenser lens which will produce a parallel beam of electrons. This parallel beam will then be focused onto the specimen by means of a short focal length lens (approximately 1 mm focal length). The reason for using a condenser lens to produce the parallel beam of electrons is that in the future a quadrupole-octupole correction system will be installed in this section of the microscope in order to attempt to correct the spherical aberrations of the objective lens and thereby improve its resolution.


2010 ◽  
Vol 30 (10) ◽  
pp. 3027-3033
Author(s):  
贺应红 He Yinghong ◽  
马臻 Ma Zhen ◽  
赵葆常 Zhao Baochang ◽  
常凌颖 Chang Lingying ◽  
陈立武 Chen Liwu ◽  
...  

2015 ◽  
Vol 42 (10) ◽  
pp. 1016002
Author(s):  
蔡红梅 Cai Hongmei ◽  
鄢定尧 Yan Dingyao ◽  
朱衡 Zhu Heng ◽  
鲍振军 Bao Zhenjun ◽  
胡江川 Hu Jiangchuan ◽  
...  

2014 ◽  
Vol 12 (s2) ◽  
pp. S21203-321209 ◽  
Author(s):  
Chunxiang Jin Chunxiang Jin ◽  
Shijie Liu Shijie Liu ◽  
You Zhou You Zhou ◽  
Xueke Xu Xueke Xu ◽  
Chaoyang Wei Chaoyang Wei ◽  
...  

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