Comparative near infrared through-focus scanning optical microscopy for 3D memory subsurface defect detection and classification

2021 ◽  
Author(s):  
Jun Ho Lee ◽  
Seokjin Na ◽  
Junhee Jeong ◽  
Ralf Buengener
Keyword(s):  
Optical Microscopy ◽  
Defect Detection ◽  
Near Infrared ◽  
Subsurface Defect ◽  
Scanning Optical Microscopy ◽  
3D Memory

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Simultaneous subsurface defect detection and contact parameter assessment in a wheel–rail system

Wear ◽  
2008 ◽  
Vol 265 (11-12) ◽  
pp. 1837-1847 ◽  
Author(s):  
Massimiliano Pau ◽  
Bruno Leban ◽  
Antonio Baldi
Keyword(s):  
Defect Detection ◽  
Contact Parameter ◽  
Rail System ◽  
Subsurface Defect
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