Nanometer-scale imaging of domains in ferroelectric thin films using apertureless near-field scanning optical microscopy

1998 ◽  
Vol 73 (22) ◽  
pp. 3229-3231 ◽  
Author(s):  
Charles Hubert ◽  
Jeremy Levy
Keyword(s):  
Thin Films ◽  
Optical Microscopy ◽  
Near Field ◽  
Ferroelectric Thin Films ◽  
Nanometer Scale ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

scholarly journals Optical nanowriting on azobenzene side-chain polymethacrylate thin films by near-field scanning optical microscopy

2003 ◽  
Vol 82 (19) ◽  
pp. 3313-3315 ◽  
Author(s):  
V. Likodimos ◽  
M. Labardi ◽  
L. Pardi ◽  
M. Allegrini ◽  
M. Giordano ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Microscopy ◽  
Near Field ◽  
Side Chain ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Measurement of Strain Associated with Defects in SiTiO3 Bicrystals using Near-Field Scanning Optical Microscopy

1997 ◽  
Vol 474 ◽  
Author(s):  
E. B. McDaniel ◽  
J. W. P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Microscope ◽  
Nanometer Scale ◽  
Polarization Modulation ◽  
Reflection Symmetry ◽  
Strain Fields ◽  
Modulation Technique ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

ABSTRACTWe incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.

Femtosecond near-field scanning optical microscopy of molecular thin films

2000 ◽  
Author(s):  
H. Kawashima ◽  
M. Furuki ◽  
S. Tatsuura ◽  
M. Tian ◽  
Y. Sato ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Microscopy ◽  
Near Field ◽  
Molecular Thin Films ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Femtosecond near-field scanning optical microscopy study of molecular thin films

2001 ◽  
Vol 202 (1) ◽  
pp. 241-243 ◽  
Author(s):  
H. Kawashima ◽  
M. Furuki ◽  
S. Tatsuura ◽  
M. Tian ◽  
Y. Sato ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Microscopy ◽  
Near Field ◽  
Microscopy Study ◽  
Molecular Thin Films ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
Sign in / Sign up

Export Citation Format

Share Document