New phase evaluation methods using electronic speckle pattern interferometry for deformation analysis

1997 ◽  
Author(s):  
Rini Widiastuti ◽  
Sanichiro J. Yoshida ◽  
Suprapedi ◽  
A. Kusnowo ◽  
M. H. br Pardede ◽  
...  
Keyword(s):  
Speckle Pattern ◽  
Evaluation Methods ◽  
Electronic Speckle Pattern Interferometry ◽  
Deformation Analysis ◽  
Phase Evaluation ◽  
New Phase

scholarly journals Phase evaluation for electronic speckle-pattern interferometry deformation analyses

1995 ◽  
Vol 20 (7) ◽  
pp. 755 ◽  
Author(s):  
Sanichiro Yoshida ◽  
Suprapedi ◽  
Rini Widiastuti ◽  
Edi Tri Astuti ◽  
Anung Kusnowo
Keyword(s):  
Speckle Pattern ◽  
Electronic Speckle Pattern Interferometry ◽  
Phase Evaluation

Phase Unwrapping Method Based on Windowed Fourier Transform

2013 ◽  
Vol 307 ◽  
pp. 321-326 ◽  
Author(s):  
Yan Bin He ◽  
Xin Zhong Li ◽  
Wei Min Chen ◽  
Jun Song Wen
Keyword(s):  
Fourier Transform ◽  
Image Quality ◽  
Speckle Pattern ◽  
Point Load ◽  
Phase Unwrapping ◽  
Electronic Speckle Pattern Interferometry ◽  
Windowed Fourier Transform ◽  
Key Technologies ◽  
Phase Map ◽  
New Phase

Phase unwrapping is one of the key technologies in electronic speckle pattern interferometry. A new phase unwrapping algorithm, based on windowed Fourier transform is proposed. The high noisy phase map is denoised by the window Fourier transform approach and then is uwrapped by the discrete cosine transform. The method is tested in this paper using a circumferentially fixed circular plate with a point load at the centre and compared with not denoised wrapped phase map and unwrapped phase map. The result shows the new proposed phase unwrapping method in denoising and improving image quality has obvious superiority.

Electronic speckle pattern interferometry for 3-D dynamic deformation analysis in industrial environments

1991 ◽  
Author(s):  
Gerd Guelker ◽  
Olaf Haack ◽  
Klaus D. Hinsch ◽  
Claudia Hoelscher ◽  
Juergen Kuls ◽  
...  
Keyword(s):  
Dynamic Deformation ◽  
Speckle Pattern ◽  
Electronic Speckle Pattern Interferometry ◽  
Deformation Analysis ◽  
Industrial Environments

Dynamic ESPI System for Spatio-Temporal Strain Analysis of a Deforming Solid Object

2006 ◽  
Vol 326-328 ◽  
pp. 95-98 ◽  
Author(s):  
Tomohisa Shiraishi ◽  
Satoru Toyooka ◽  
Hirofumi Kadono ◽  
Takayuki Saito ◽  
Sun Ping
Keyword(s):  
Speckle Pattern ◽  
Plane Deformation ◽  
Strain Analysis ◽  
Electronic Speckle Pattern Interferometry ◽  
Deformation Analysis ◽  
Al Alloy ◽  
Alloy Sample ◽  
Speckle Patterns ◽  
Stress Curve ◽  
Spatio Temporal

In Dynamic Electronic Speckle Pattern Interferometry (DESPI), deformation analysis could be done for successively acquired frame data of interfering speckle patterns with no additional frames like phase shifting speckle patterns. Our final goal is to obtain a temporally varying process of two-dimensional strain field. Two normal strains and shearing strain are derived by numerical derivatives of two components of in-plane deformation. Analyzed results of tensile experiments of an Al-alloy sample will be shown. In the experiments, propagation of a strain localization band accompanied by serration of a stress curve was clearly observed quantitatively analyzed.

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