Angle-dependent total electron yield spectra in multilayer films for standing wave measurements

2004 ◽  
Author(s):  
Takeo Ejima ◽  
Yasuji Muramatsu ◽  
Hisataka Takenaka
Keyword(s):  
Standing Wave ◽  
Multilayer Films ◽  
Total Electron Yield ◽  
Total Electron ◽  
Wave Measurements ◽  
Electron Yield

Total-Electron-Yield X-Ray Standing-Wave Measurements of Multilayer X-Ray Mirrors for Interface Structure Evaluation

2002 ◽  
Vol 41 (Part 1, No. 6B) ◽  
pp. 4250-4252 ◽  
Author(s):  
Yasuji Muramatsu ◽  
Hisataka Takenaka ◽  
Eric M. Gullikson ◽  
Rupert C. C. Perera
Keyword(s):  
Standing Wave ◽  
Interface Structure ◽  
Total Electron Yield ◽  
Total Electron ◽  
X Ray ◽  
Wave Measurements ◽  
Electron Yield ◽  
Structure Evaluation

Effect of the Soft X-Ray Standing Wave Fields on the Total Electron Yield Spectra from an InP Crystal

1985 ◽  
Vol 24 (Part 2, No. 6) ◽  
pp. L475-L477 ◽  
Author(s):  
Toshiaki Ohta ◽  
Hideo Sekiyama ◽  
Yoshinori Kitajima ◽  
Haruo Kuroda ◽  
Toshio Takahashi ◽  
...  
Keyword(s):  
Standing Wave ◽  
Total Electron Yield ◽  
Total Electron ◽  
Wave Fields ◽  
X Ray ◽  
Electron Yield

Top layer's thickness dependence on total electron-yield X-ray standing-wave

2005 ◽  
Vol 144-147 ◽  
pp. 897-899 ◽  
Author(s):  
Takeo Ejima ◽  
Atsushi Yamazaki ◽  
Takanori Banse ◽  
Tadashi Hatano
Keyword(s):  
Standing Wave ◽  
Thickness Dependence ◽  
Total Electron Yield ◽  
Total Electron ◽  
X Ray ◽  
Electron Yield

Total Electron Yield Detector Working at Low Temperature for Linear Dichroïsm Studies on Monocrystalline Samples

1997 ◽  
Vol 7 (C2) ◽  
pp. C2-325-C2-326
Author(s):  
C. Revenant-Brizard ◽  
J. R. Regnard ◽  
J. Mimault ◽  
D. Duclos ◽  
J. J. Faix
Keyword(s):  
Low Temperature ◽  
Linear Dichroism ◽  
Total Electron Yield ◽  
Total Electron ◽  
Electron Yield
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