Measurement of refractive indices and optical axis of a uniaxial crystal assisted by Brewster angle and reflectivity fitting techniques

2010 ◽  
Author(s):  
J. H. Xing
2009 ◽  
Vol 42 (5) ◽  
pp. 878-884 ◽  
Author(s):  
Leonas Dumitrascu ◽  
Irina Dumitrascu ◽  
Dana Ortansa Dorohoi

This paper presents a simplified data acquisition and analysis technique for use in determining the main refractive indices and thickness of a uniaxial anisotropic layer cut out parallel to the optical axis, by processing the conoscopic interference figures obtained using a polarizing microscope equipped with a CCD camera. For negative uniaxial crystals, the equations used permit the calculation of the optical sign of the studied material so it is not necessary to insert a quartz wedge into the conoscopic beam. The technique can also be applied to the study of liquid crystal layers in a planar orientation.


2018 ◽  
Vol 26 (2) ◽  
pp. 1290 ◽  
Author(s):  
Jianbin Zhang ◽  
Kangzhu Zhou ◽  
Jinhui Liang ◽  
Zhaoyu Lai ◽  
Xianglin Yang ◽  
...  

2021 ◽  
Author(s):  
rong lin ◽  
Mengyu Chen ◽  
Yonglei Liu ◽  
Hui Zhang ◽  
Gregory Gbur ◽  
...  

Optik ◽  
2019 ◽  
Vol 176 ◽  
pp. 350-356 ◽  
Author(s):  
Qiangbo Suo ◽  
Yiping Han ◽  
Zhiwei Cui

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