Conoscopic method for determination of main refractive indices and thickness of a uniaxial crystal cut out parallel to its optical axis
2009 ◽
Vol 42
(5)
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pp. 878-884
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Keyword(s):
This paper presents a simplified data acquisition and analysis technique for use in determining the main refractive indices and thickness of a uniaxial anisotropic layer cut out parallel to the optical axis, by processing the conoscopic interference figures obtained using a polarizing microscope equipped with a CCD camera. For negative uniaxial crystals, the equations used permit the calculation of the optical sign of the studied material so it is not necessary to insert a quartz wedge into the conoscopic beam. The technique can also be applied to the study of liquid crystal layers in a planar orientation.
2016 ◽
Vol 625
(1)
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pp. 154-162
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1978 ◽
Vol 25
(2)
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pp. 206-210
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Keyword(s):
2007 ◽
Vol 103
(4)
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pp. 646-650
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