Influence of Substrate Crystal Structure on the Magnetic Anisotropy of MnxSi1 – x (x ≈ 0.5) Films

Author(s):  
A. B. Drovosekov ◽  
L. S. Parshina ◽  
O. D. Khramova ◽  
D. S. Gusev ◽  
O. A. Novodvorsky ◽  
...  
2002 ◽  
Author(s):  
Alexei Sozinov ◽  
Alexander A. Likhachev ◽  
Nataliya Lanska ◽  
Kari Ullakko ◽  
Veikko K. Lindroos

Nature ◽  
1937 ◽  
Vol 140 (3551) ◽  
pp. 896-897 ◽  
Author(s):  
K. S. KRISHNAN ◽  
A. MOOKHERJI

2014 ◽  
Vol 215 ◽  
pp. 242-245
Author(s):  
Evgeny M. Artemyev ◽  
Lev E. Yakimov

Phase composition, crystal structure and magnetic properties of ordering FePd and Fe50Pd50-xPtx(х = 1-10 atomic %) alloy films were studied. Spectral dependencies of Faraday rotation and optical absorption were measured. We studied how thermal treatment affects crystal structure, magnetization and coercive force in ordered alloys and how the degree of atomic order affects the value of perpendicular magnetic anisotropy. It was shown that near equiatomic ordered FePd and Fe50Pd50-xPtx(х = 1-10 at. %) alloy films can be used as medium for magnetic and thermo-magnetic data recording.


1998 ◽  
Vol 22 (S_1_ISFA_97) ◽  
pp. S1_328-330 ◽  
Author(s):  
Mitsuhiro KATAOKA ◽  
Akio HASEBE ◽  
Etsuo OTSUKI

1997 ◽  
Vol 475 ◽  
Author(s):  
Yong-Jin Song ◽  
Byung-Il Lee ◽  
Seung-Ki Joo

ABSTRACT[Cu(20Å)/NiFe(7Å)/Ni(6Å)/NiFe(7Å)]10Cu(50Å) multilayers were deposited on 4 ° tilt-cut Si(lll) using 3-gun rf magnetron sputtering system. An in-plane uniaxial magnetic anisotropy was found and the uniaxial magnetic anisotropy constant was about 3×104 erg/cm3. The multilayers on non tilt-cut Si(lll) with Cu underlayer did not show any anisotropy. The crystal structure of the multilayer on 4 ° tilt-cut Si(111) was studied using TEM work and the magnetic anisotropy is originated from the growth of (110) preferred orientation of the multilayer. When other material such as Ni or NiFe was used as an underlayer for the multilayer, the magnetic anisotropy disappeared and the crystal structure was (111). The multilayer without underlayer did not show any magnetic anisotropy either. It is thought that Cu underlayer was grown with (110) orientation on 4 ° tilt-cut Si(111) through the ledges in Si wafer and worked as a template for the growth of the multilayer.


1988 ◽  
Vol 64 (10) ◽  
pp. 5084-5087 ◽  
Author(s):  
M. Solzi ◽  
L. Pareti ◽  
O. Moze ◽  
W. I. F. David

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