Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Ryota Takahashi; Hiroyuki Handa; Shunsuke Abe; Kei Imaizumi; Hirokazu Fukidome; Akitaka Yoshigoe; Yuden Teraoka; Maki Suemitsu

doi:10.1143/jjap.50.070103

Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.070103 ◽

2011 ◽

Vol 50 (7) ◽

pp. 070103 ◽

Cited By ~ 9

Author(s):

Ryota Takahashi ◽

Hiroyuki Handa ◽

Shunsuke Abe ◽

Kei Imaizumi ◽

Hirokazu Fukidome ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

Download Full-text

Low-Energy-Electron-Diffraction and X-ray-Phototelectron-Spectroscopy Studies of Graphitization of 3C-SiC(111) Thin Film on Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.070103 ◽

2011 ◽

Vol 50 (7R) ◽

pp. 070103 ◽

Cited By ~ 16

Author(s):

Ryota Takahashi ◽

Hiroyuki Handa ◽

Shunsuke Abe ◽

Kei Imaizumi ◽

Hirokazu Fukidome ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

Download Full-text

Low Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of the Formation of Submonolayer Interfaces of Sb/Si(111)

Japanese Journal of Applied Physics ◽

10.1143/jjap.27.147 ◽

1988 ◽

Vol 27 (Part 1, No. 1) ◽

pp. 147-148 ◽

Cited By ~ 82

Author(s):

Chong-Yun Park ◽

Tadashi Abukawa ◽

Toyohiko Kinoshita ◽

Yoshiharu Enta ◽

Shozo Kono

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

Download Full-text

Low-Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of Sb-induced Reconstruction on Si(113)3×2 Surface

Japanese Journal of Applied Physics ◽

10.1143/jjap.39.2771 ◽

2000 ◽

Vol 39 (Part 1, No. 5A) ◽

pp. 2771-2774 ◽

Cited By ~ 8

Author(s):

Ki-Seok An ◽

Chan-Cuk Hwang ◽

Chong-Yun Park ◽

Akito Kakizaki

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies

Download Full-text

Structures of sulfur on TiO2() determined by scanning tunneling microscopy, X-ray photoelectron spectroscopy and low-energy electron diffraction

Surface Science ◽

10.1016/s0039-6028(00)00849-9 ◽

2001 ◽

Vol 470 (3) ◽

pp. 347-360 ◽

Cited By ~ 56

Author(s):

E.L.D. Hebenstreit ◽

W. Hebenstreit ◽

U. Diebold

Keyword(s):

Electron Diffraction ◽

Scanning Tunneling Microscopy ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

Download Full-text

Low energy electron diffraction and electron spectroscopy studies of the clean (110) and (100) titanium dioxide (rutile) crystal surfaces

Surface Science ◽

10.1016/0039-6028(77)90064-4 ◽

1977 ◽

Vol 64 (2) ◽

pp. 588-602 ◽

Cited By ~ 263

Author(s):

Y.W. Chung ◽

W.J. Lo ◽

G.A. Somorjai

Keyword(s):

Titanium Dioxide ◽

Electron Diffraction ◽

Electron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Crystal Surfaces ◽

Low Energy Electron Diffraction ◽

Rutile Crystal ◽

Low Energy Electron ◽

Spectroscopy Studies

Download Full-text

Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

Applied Physics Letters ◽

10.1063/1.4905651 ◽

2015 ◽

Vol 106 (2) ◽

pp. 021602 ◽

Cited By ~ 18

Author(s):

O. Romanyuk ◽

S. Fernández-Garrido ◽

P. Jiříček ◽

I. Bartoš ◽

L. Geelhaar ◽

...

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Gan Nanowire ◽

Non Destructive

Download Full-text

InSb–CdTe interfaces: A combined study by soft x-ray photoemission, low-energy electron diffraction, and Raman spectroscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.583719 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1233 ◽

Cited By ~ 28

Author(s):

K. J. Mackey

Keyword(s):

Raman Spectroscopy ◽

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

Download Full-text

Low‐energy electron diffraction study of a disordered monolayer of H2O on Pt(111) and an ordered thin film of ice grown on Pt(111)

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578092 ◽

1992 ◽

Vol 10 (4) ◽

pp. 2521-2528 ◽

Cited By ~ 39

Author(s):

U. Starke ◽

K. Heinz ◽

N. Materer ◽

A. Wander ◽

M. Michl ◽

...

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Diffraction Study ◽

Electron Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

Download Full-text

X-ray photoelectron diffraction and low-energy electron diffraction study of the interaction of oxygen with the Ni(001) surface: c(2 × 2) to saturated oxide

Surface Science ◽

10.1016/0039-6028(93)90608-m ◽

1993 ◽

Vol 282 (1-2) ◽

pp. 33-61 ◽

Cited By ~ 72

Author(s):

R.S. Saiki ◽

A.P. Kaduwela ◽

M. Sagurton ◽

J. Osterwalder ◽

D.J. Friedman ◽

...

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Electron Diffraction Study ◽

Low Energy ◽

Energy Electron ◽

X Ray ◽

Photoelectron Diffraction ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

Download Full-text

Reactivity towards oxygen of surfaces investigated by ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy and low energy electron diffraction spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/0368-2048(95)02361-5 ◽

1995 ◽

Vol 74 (2) ◽

pp. 129-134 ◽

Cited By ~ 5

Author(s):

S. Di Nardo ◽

L. Lozzi ◽

M. Passacantando ◽

P. Picozzi ◽

S. Santucci

Keyword(s):

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Ultraviolet Photoelectron Spectroscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

Download Full-text