Structural, Spectroscopic, and Electrochemical Characterization of Boron‐Doped Diamond Films from Different Provenances

1998 ◽  
Vol 145 (5) ◽  
pp. L85-L88 ◽  
Author(s):  
Lin‐Feng Li ◽  
Dana A. Totir ◽  
Natalia Vinokur ◽  
Barry Miller ◽  
Gary Chottiner ◽  
...  
Keyword(s):  
Diamond Films ◽  
Electrochemical Characterization ◽  
Boron Doped Diamond ◽  
Boron Doped

scholarly journals AFM studies and electrochemical characterization of boron-doped diamond surfaces modified with metal oxides by the Sol-Gel method

2006 ◽  
Vol 17 (2) ◽  
pp. 257-264 ◽  
Author(s):  
Hugo B. Suffredini ◽  
Giancarlo R. Salazar-Banda ◽  
Sônia T. Tanimoto ◽  
Marcelo L. Calegaro ◽  
Sergio A. S. Machado ◽  
...  
Keyword(s):  
Metal Oxides ◽  
Sol Gel ◽  
Electrochemical Characterization ◽  
Boron Doped Diamond ◽  
Diamond Surfaces ◽  
Gel Method ◽  
Sol Gel Method ◽  
Boron Doped

Optical and electrical characterization of boron-doped diamond films

1995 ◽  
Vol 4 (5-6) ◽  
pp. 678-683 ◽  
Author(s):  
R. Locher ◽  
J. Wagner ◽  
F. Fuchs ◽  
M. Maier ◽  
P. Gonon ◽  
...  
Keyword(s):  
Diamond Films ◽  
Electrical Characterization ◽  
Boron Doped Diamond ◽  
Boron Doped

Growth and characterization of ZnO nanorod arrays on boron-doped diamond films by low temperature hydrothermal reaction

2012 ◽  
Vol 539 ◽  
pp. 200-204 ◽  
Author(s):  
Shiyong Gao ◽  
Dongmei Li ◽  
Yingai Li ◽  
Xianyi Lv ◽  
Jinzhong Wang ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hydrothermal Reaction ◽  
Diamond Films ◽  
Zno Nanorod ◽  
Nanorod Arrays ◽  
Zno Nanorod Arrays ◽  
Boron Doped Diamond ◽  
Boron Doped

Fabrication and Electrochemical Characterization of Boron-Doped Diamond Microdisc Array Electrodes

2002 ◽  
Vol 31 (5) ◽  
pp. 502-503 ◽  
Author(s):  
Kentaro Tsunozaki ◽  
Yasuaki Einaga ◽  
Tata N. Rao ◽  
Akira Fujishima
Keyword(s):  
Electrochemical Characterization ◽  
Boron Doped Diamond ◽  
Boron Doped

Characterization of boron-doped diamond films using (CH4-CO2) gas mixtures with B(OCH3)3 as a dopant source by MPCVD

1994 ◽  
Vol 248 (2) ◽  
pp. 149-155 ◽  
Author(s):  
C.-F. Chen ◽  
S.-H. Chen ◽  
T.-M. Hong ◽  
T.-C. Wang
Keyword(s):  
Diamond Films ◽  
Gas Mixtures ◽  
Boron Doped Diamond ◽  
Co2 Gas ◽  
Boron Doped ◽  
Dopant Source

TL, OSL, Raman spectroscopy and SEM characterization of boron doped diamond films

2005 ◽  
Vol 202 (11) ◽  
pp. 2154-2159 ◽  
Author(s):  
M. Pedroza-Montero ◽  
V. Chernov ◽  
B. Castañeda ◽  
R. Meléndrez ◽  
J. A. N. Gonçalves ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Diamond Films ◽  
Boron Doped Diamond ◽  
Boron Doped

Characterization of heavily boron-doped diamond films

1996 ◽  
Vol 5 (11) ◽  
pp. 1288-1294 ◽  
Author(s):  
R.J. Zhang ◽  
S.T. Lee ◽  
Y.W. Lam
Keyword(s):  
Diamond Films ◽  
Boron Doped Diamond ◽  
Boron Doped

Deposition and Characterization of Boron-Doped HFCVD Diamond Films on Ti, SiC, Si and Ta Substrates

2012 ◽  
Vol 217-219 ◽  
pp. 1062-1067 ◽  
Author(s):  
Xin Chang Wang ◽  
Bin Shen ◽  
Fang Hong Sun
Keyword(s):  
Diamond Films ◽  
Indentation Test ◽  
Rockwell Hardness ◽  
Trimethyl Borate ◽  
Boron Doped Diamond ◽  
Hardness Tester ◽  
Boron Doped ◽  
Deposition Parameters ◽  
Fesem Micrographs

In the present investigation, titanium (Ti), silicon carbide (SiC), silicon (Si) and tantalum (Ta) samples with the same geometry are selected as substrates to deposite HFCVD boron-doped diamond films with the same deposition parameters, using trimethyl borate as the dopant. FESEM, EDS, Raman spectroscopy and Rockwell hardness tester are used to characterize as-deposited boron-doped diamond (BDD) films. The FESEM micrographs exhibit that the film deposited on Si substrate presents the best uniformity and that on Ti substrate has smallest grain size and film thickness, with titanium element detected in the EDS spectra. Moreover, it’s speculated by indentation test that the adhesive strength between the BDD films and different substrates can be order as SiC>Ta>Ti for the different thermal expansion coefficient gaps between the substrate and diamond, and the hardness of the BDD coated samples measured using Rockwell hardness tester can also be order as SiC>Ta>Ti due to the different hardness of substrate materials. Finally, similar and representative characterization for BDD films is obtained from the Raman spectra for all the BDD films on different substrates.

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