Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect

2010 ◽  
Vol 157 (2) ◽  
pp. J29 ◽  
Author(s):  
Chia-Sheng Lin ◽  
Ying-Chung Chen ◽  
Ting-Chang Chang ◽  
Hung-Wei Li ◽  
Wei-Che Hsu ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Negative Bias ◽  
Negative Bias Temperature Instability ◽  
Silicon Thin Film ◽  
Temperature Instability ◽  
Bias Temperature Instability ◽  
Illumination Effect

An Investigation of Bias Temperature Instability in Hydrogenated Low-Temperature Polycrystalline Silicon Thin Film Transistors

2002 ◽  
Vol 41 (Part 1, No. 9) ◽  
pp. 5517-5522 ◽  
Author(s):  
Ching-Wei Lin ◽  
Chang-Ho Tseng ◽  
Ting-Kuo Chang ◽  
Yuan-Hsun Chang ◽  
Fang-Tsun Chu ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Temperature Instability ◽  
Bias Temperature Instability
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