(Invited) Modeling and Characterizing Defects in Semiconductors for Photovoltaics

ECS Meeting Abstracts ◽

10.1149/ma2021-0212630mtgabs ◽

2021 ◽

Vol MA2021-02 (12) ◽

pp. 630-630

Author(s):

Angus Rockett

Keyword(s):

Defects In Semiconductors

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Point Defects in Semiconductors: Microscopic Identification, Metastable Properties, Defect Migration, and Diffusion

10.21236/ada206947 ◽

1989 ◽

Author(s):

James A. Van Vechten ◽

John F. Wager

Keyword(s):

Point Defects ◽

Defect Migration ◽

Microscopic Identification ◽

Defects In Semiconductors ◽

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2014 Defects in Semiconductors Gordon Research Conference & Gordon Research Seminar. Research Area 1: Materials Science, 1.3 Physical Properties of Materials

10.21236/ada627275 ◽

2014 ◽

Author(s):

Christian M. Wetzel ◽

Audrius Alkauskas

Keyword(s):

Physical Properties ◽

Materials Science ◽

Research Area ◽

Research Seminar ◽

Research Conference ◽

Properties Of Materials ◽

Defects In Semiconductors

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Band Tailings and Deep Defects in Semiconductors: Theory and Formalism

Defect and Diffusion Forum ◽

10.4028/www.scientific.net/ddf.133.18 ◽

1996 ◽

Vol 133 ◽

pp. 18-47

Author(s):

A.A. Teate ◽

N.C. Halder

Keyword(s):

Defects In Semiconductors ◽

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Convergence of supercell calculations for point defects in semiconductors: Vacancy in silicon

Physical Review B ◽

10.1103/physrevb.58.1318 ◽

1998 ◽

Vol 58 (3) ◽

pp. 1318-1325 ◽

Author(s):

M. J. Puska ◽

S. Pöykkö ◽

M. Pesola ◽

R. M. Nieminen

Keyword(s):

Point Defects ◽

Defects In Semiconductors

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Proceedings of the 22nd International Conference on Defects in Semiconductors

Physica B Condensed Matter ◽

10.1016/s0921-4526(03)01138-4 ◽

2003 ◽

Vol 340-342 ◽

pp. v ◽

Keyword(s):

International Conference ◽

Defects In Semiconductors

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A mechanism for two-electron capture at deep level defects in semiconductors

Microelectronics Reliability ◽

10.1016/0026-2714(89)90520-9 ◽

1989 ◽

Vol 29 (4) ◽

pp. 663

Keyword(s):

Electron Capture ◽

Defects In Semiconductors

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Extended Defects in Semiconductors

Crystal Research and Technology ◽

10.1002/crat.2170280126 ◽

1993 ◽

Vol 28 (1) ◽

pp. K8-K9

Author(s):

H. Alexander

Keyword(s):

Extended Defects ◽

Defects In Semiconductors

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Theory of Defects in Semiconductors: Recent Developments and Challenges

The Electrochemical Society Interface ◽

10.1149/2.f06051if ◽

2005 ◽

Vol 14 (1) ◽

pp. 28-31

Author(s):

Stefan K. Estreicher

Keyword(s):

Recent Developments ◽

Defects In Semiconductors

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Internal Friction Due to Defects in Semiconductors

Point and Extended Defects in Semiconductors - NATO ASI Series ◽

10.1007/978-1-4684-5709-4_5 ◽

1989 ◽

pp. 65-75

Author(s):

P. Haasen ◽

U. Jendrich ◽

D. Laszig

Keyword(s):

Internal Friction ◽

Defects In Semiconductors

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Structure and Properties of Point Defects in Semiconductors

Point and Extended Defects in Semiconductors - NATO ASI Series ◽

10.1007/978-1-4684-5709-4_1 ◽

1989 ◽

pp. 1-14 ◽

Author(s):

L. C. Kimerling

Keyword(s):

Point Defects ◽

Structure And Properties ◽

Defects In Semiconductors

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