X-Ray Diffraction Study of Shock-Modified Tetragonal Phases of SnO2 and MnO2

1992 ◽  
Vol 36 ◽  
pp. 595-601
Author(s):  
P. Newcomer ◽  
B. Morosin ◽  
R. A. Graham
Keyword(s):  
Shock Loading ◽  
Crystal Size ◽  
Lattice Strain ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Coherent Crystal

AbstractX-ray diffraction line-profile analysis on tetragonal forms of SnO2 (cassiterite), MnO2 (pyrolusite), and previously studied TiO2 (rutile), which were subjected to high pressure shock loading, show that residual lattice strain and coherent “crystal” size are a function of shock parameters. An interesting observation on a sample of MnO2 concerns the recovery of cubic Mn2O3 (bixbyite) in the material subjected to 22 GPa, indicating a shock-induced chemical synthesis.

Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis

2000 ◽  
Vol 640 ◽  
Author(s):  
C. Seitz ◽  
A. Magerl ◽  
R. Hock ◽  
H. Heissenstein ◽  
R. Helbig
Keyword(s):  
Line Profile ◽  
Correlation Length ◽  
Defect Structure ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Defect Structures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures ◽  
Diffraction Line Profile

ABSTRACTWe have investigated by x-ray diffraction defect structures in 6H-SiC after neutron irradiation with different fluences and followed by different annealing procedures. An interpretation along a model of Klimanek [1, 4–6] shows, that higher fluences lead to a stronger than linear reduction of the correlation length, whereas higher annealing temperatures correlate with a better recovery of the correlation length. In addition defects of 1st kind created by irradiation are reduced by annealing. We find that annealing changes the character of the defects and it accentuates a defect structure already present in the original samples.

Dislocation densities and crystallite size distributions in nanocrystalline ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), determined by X-ray diffraction line-profile analysis

2005 ◽  
Vol 38 (6) ◽  
pp. 912-926 ◽  
Author(s):  
G. Ribárik ◽  
N. Audebrand ◽  
H. Palancher ◽  
T. Ungár ◽  
D. Louër
Keyword(s):  
Crystallite Size ◽  
Line Profile ◽  
Interference Effect ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Size Distributions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Dislocation Densities

The dislocation densities and crystallite size distributions in ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), of the fluorite structure type have been determined as a function of milling time by X-ray diffraction line-profile analysis. The treatment has been based on the concept of dislocation contrast to explain strain anisotropy by means of the modified Williamson–Hall and Warren–Averbach approaches and a whole-profile fitting method using physically based functions. In most cases, the measured and calculated patterns are in perfect agreement; however, in some specific cases, the first few measured profiles appear to be narrower than the calculated ones. This discrepancy is interpreted as the result of an interference effect similar to that described by Rafaja, Klemm, Schreiber, Knapp & Kužel [J. Appl. Cryst.(2004),37, 613–620]. By taking into account and correcting for this interference effect, the microstructure of ball-milled fluorides is determined in terms of dislocation structure and size distributions of coherent domains. A weak coalescence of the crystallites is observed at longer milling periods. An incubation period in the evolution of microstrains is in correlation with the homologous temperatures of the fluorides.

scholarly journals X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis

2001 ◽  
Vol 378-381 ◽  
pp. 753-758
Author(s):  
Alexandre Boulle ◽  
C. Legrand ◽  
P. Thomas ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Stacking Disorder
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