Book Review: Jensen, P. S., Knapp, P., & Mrazek, D. A. (2006). Toward a New Diagnostic System for Child Psychopathology: Moving Beyond the DSM. New York: Guilford Press. ix, 194 pp
A. R. Overman and R. V. Scholtz III.: Mathematical Models of Crop Growth and Yield. Marcel Dekker, 270 Madison Avenue, New York, NY 10016. 2002. Hardcover, 344 pp., 150.00. ISBN 0-8247-0825-3.
Toward a New Diagnostic System for Child Psychopathology: Moving Beyond the DSMby Peter S. Jensen, Penny Knapp, David A. Mrazek. New York, The Guilford Press, 2006, 194 pp., $30.00.