Mixed-Signal Circuit Testing Using Wavelet Signatures

Mixed-Signal Circuits ◽

10.1201/b19378-9 ◽

2018 ◽

pp. 142-161

Author(s):

Michael G. Dimopoulos

Keyword(s):

Circuit Testing ◽

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A configurable built in current sensor for mixed signal circuit testing

9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. ◽

10.1109/olt.2003.1214392 ◽

2004 ◽

Author(s):

R. Picos ◽

J. Font ◽

E. Isern ◽

M. Roca ◽

E. Garcia

Keyword(s):

Current Sensor ◽

Circuit Testing ◽

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Wavelet analysis of current measurements for mixed-signal circuit testing

Proceedings of 2010 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2010.5537999 ◽

2010 ◽

Author(s):

M. G. Dimopoulos ◽

D. K. Papakostas ◽

B. D. Vassios ◽

A. A. Hatzopoulos

Keyword(s):

Wavelet Analysis ◽

Circuit Testing ◽

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Analog/Mixed-Signal Circuit Testing Technologies in IoT Era

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict49897.2020.9278194 ◽

2020 ◽

Author(s):

Haruo Kobayashi ◽

Anna Kuwana ◽

Jianglin Wei ◽

Yujie Zhao ◽

Shogo Katayama ◽

...

Keyword(s):

Circuit Testing ◽

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A tutorial introduction to research on analog and mixed-signal circuit testing

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/82.728852 ◽

1998 ◽

Vol 45 (10) ◽

pp. 1389-1407 ◽

Author(s):

L.S. Milor

Keyword(s):

Circuit Testing ◽

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Implementation of Low-Cost Reconfigurable External Mixed-Signal VLSI Circuit Testing System

Australian Journal of Electrical & Electronics Engineering ◽

10.1080/1448837x.2010.11464259 ◽

2010 ◽

Vol 7 (1) ◽

pp. 73-82

Author(s):

S.Z. Islam ◽

M.A.M. Ali

Keyword(s):

Low Cost ◽

Testing System ◽

Vlsi Circuit ◽

Circuit Testing ◽

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Mixed-signal circuit testing-A review

Proceedings of Third International Conference on Electronics, Circuits, and Systems ◽

10.1109/icecs.1996.584604 ◽

2002 ◽

Author(s):

Chin-Long Wey

Keyword(s):

Circuit Testing ◽

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A case study of mixed-signal integrated circuit testing: an application of current testing using the upper limit and the lower limit

Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94 ◽

10.1109/iscas.1994.409304 ◽

2002 ◽

Author(s):

Y. Miura ◽

S. Naito ◽

K. Kinoshita

Keyword(s):

Lower Limit ◽

Integrated Circuit ◽

Circuit Testing ◽

Mixed Signal ◽

Current Testing ◽

Integrated Circuit Testing ◽

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Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097100 ◽

2017 ◽

Author(s):

Masayuki Kawabata ◽

Koji Asami ◽

Shohei Shibuya ◽

Tomonori Yanagida ◽

Haruo Kobayashi

Keyword(s):

Signal Generation ◽

Circuit Testing ◽

Mixed Signal ◽

Low Distortion ◽

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Efficient and Accurate Testing of On-Chip ADC Based on ATE

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.380-384.3378 ◽

2013 ◽

Vol 380-384 ◽

pp. 3378-3381

Author(s):

Shu Hua Wei ◽

Lan Dai ◽

Xiao Bo Zhang ◽

Yan Feng Jiang

Keyword(s):

Ip Core ◽

Circuit Testing ◽

Mixed Signal ◽

Test Experiment ◽

Testing Method ◽

Verification System ◽

The embedded digital-analog mixed-signal circuit testing has become one of the difficulties to be solved. In this paper, a SoC embedded ADC has been tested based on the Credence Gemini500 verification system. The testing method is studied and verified through the test experiment and results. This testing method is an important reference for general embedded IP core testing.

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Subband Filtering for Time and Frequency Analysis of Mixed-Signal Circuit Testing

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2003.820494 ◽

2004 ◽

Vol 53 (2) ◽

pp. 602-611 ◽

Author(s):

J. Roh ◽

J.A. Abraham

Keyword(s):

Frequency Analysis ◽

Circuit Testing ◽

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