OS1(2)-6(OS01W0200) Sub-Micron Displacement Measurement Using a Digital Image Correlation Method
2008 ◽
Vol 2008.21
(0)
◽
pp. 802-803
2000 ◽
Vol 2000.2
(0)
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pp. 531-532
2014 ◽
Vol 52
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pp. 75-85
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2003 ◽
Vol 2003.2
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pp. _OS01W0200-_OS01W0200
2020 ◽
Vol 12
(02)
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2021 ◽
pp. 1-22