scholarly journals An Evaluation of the Creep-Fatigue Interaction in 316FR Steel in a Very High Vacuum Environment Based on an Overstress Concept.

1996 ◽  
Vol 62 (601) ◽  
pp. 1979-1984
Author(s):  
Tatsuro NAKAI ◽  
Takashi SUGIURA ◽  
Toshiya NAKAMURA ◽  
Yasuhide ASADA
Keyword(s):  
High Vacuum ◽  
Creep Fatigue ◽  
Very High ◽  
High Vacuum Environment

scholarly journals Creep-Fatigue Interaction of 21/4Cr-1Mo Steel in a Very High Vacuum Environment

1988 ◽  
Vol 31 (3) ◽  
pp. 627-633 ◽  
Author(s):  
Tai ASAYAMA ◽  
Shi-Zhen CHENG ◽  
Yukio TACHIBANA ◽  
Yasuhide ASADA
Keyword(s):  
High Vacuum ◽  
Creep Fatigue ◽  
Very High ◽  
High Vacuum Environment

Creep-Fatigue Evaluation Based on the Overstress

1991 ◽  
Vol 113 (2) ◽  
pp. 187-193 ◽  
Author(s):  
Y. Asada ◽  
Y. Okamoto ◽  
T. Hashimoto
Keyword(s):  
Fatigue Behavior ◽  
High Vacuum ◽  
Back Stress ◽  
Strain Response ◽  
Fatigue Data ◽  
Creep Fatigue ◽  
Fatigue Evaluation ◽  
Damage Equation ◽  
Very High ◽  
High Vacuum Environment

There is summarized a series of creep-fatigue data on a normalized and tempered 2 1/4Cr-1Mo steel obtained at 550°C in a very high vacuum environment under a wide variety of a strain-time program. A special feature of a stress-strain response of the steel is described to give the overstress and the internal back stress. A damage equation is developed to predict a creep-fatigue behavior which is free from the environmental effect.

scholarly journals Solid-State Dewetting Dynamics of Amorphous Ge Thin Films on Silicon Dioxide Substrates

Nanomaterials ◽  
2020 ◽  
Vol 10 (12) ◽  
pp. 2542
Author(s):  
Dimosthenis Toliopoulos ◽  
Alexey Fedorov ◽  
Sergio Bietti ◽  
Monica Bollani ◽  
Emiliano Bonera ◽  
...  
Keyword(s):  
Thin Films ◽  
Amorphous Material ◽  
High Vacuum ◽  
High Energy ◽  
Ex Situ ◽  
Material Transport ◽  
Dewetting Process ◽  
Very High ◽  
High Vacuum Environment

We report on the dewetting process, in a high vacuum environment, of amorphous Ge thin films on SiO2/Si (001). A detailed insight of the dewetting is obtained by in situ reflection high-energy electron diffraction and ex situ scanning electron microscopy. These characterizations show that the amorphous Ge films dewet into Ge crystalline nano-islands with dynamics dominated by crystallization of the amorphous material into crystalline nano-seeds and material transport at Ge islands. Surface energy minimization determines the dewetting process of crystalline Ge and controls the final stages of the process. At very high temperatures, coarsening of the island size distribution is observed.

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