scholarly journals Problem of multiple interpolation in class of analytical functions of zero order in half-plane

2014 ◽  
Vol 6 (1) ◽  
pp. 18-28 ◽  
Author(s):  
Oksana Anatol'evna Bozhenko ◽  
Konstantin Gennadyevich Malyutin
Keyword(s):  
Half Plane ◽  
Zero Order ◽  
Analytical Functions ◽  
Multiple Interpolation

scholarly journals Determination of the Stress Field of the Brittle Rock Caused by Quasistatic Load

2016 ◽  
Vol 16 (1) ◽  
pp. 29-32
Author(s):  
Marine Losaberidze ◽  
Mamuka Vazagasvili ◽  
Mikheil Tutberidze
Keyword(s):  
Mathematical Model ◽  
Stress Field ◽  
Half Plane ◽  
Constant Velocity ◽  
Brittle Rock ◽  
Analytical Functions ◽  
The Mathematical Model

Abstract In the paper the mathematical model has been proposed according of which the rock is considered as an orthotropic half-plane. On the boundary of this half-plane the loads, moving at a constant velocity, exert a pressure. The problem was solved by means of the theory of analytical functions.

Multiple Interpolation by the Functions of Finite Order in the Half-plane. II

2021 ◽  
Vol 42 (4) ◽  
pp. 811-822
Author(s):  
K. Malyutin ◽  
M. Kabanko ◽  
I. Kozlova
Keyword(s):  
Finite Order ◽  
Half Plane ◽  
Multiple Interpolation

Strain measurement in In0.2Ga0.8As/GaAs quantum wires by convergent beam electron diffraction

1995 ◽  
Vol 53 ◽  
pp. 444-445
Author(s):  
S. Hillyard ◽  
Y.-P. Chen ◽  
J.D. Reed ◽  
W.J. Schaff ◽  
L.F. Eastman ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Semiconductor Lasers ◽  
Quantum Wire ◽  
Quantum Wires ◽  
Convergent Beam Electron Diffraction ◽  
Zero Order ◽  
Beam Electron ◽  
Local Lattice ◽  
Device Applications ◽  
Convergent Beam

The positions of high-order Laue zone (HOLZ) lines in the zero order disc of convergent beam electron diffraction (CBED) patterns are extremely sensitive to local lattice parameters. With proper care, these can be measured to a level of one part in 104 in nanometer sized areas. Recent upgrades to the Cornell UHV STEM have made energy filtered CBED possible with a slow scan CCD, and this technique has been applied to the measurement of strain in In0.2Ga0.8 As wires.Semiconductor quantum wire structures have attracted much interest for potential device applications. For example, semiconductor lasers with quantum wires should exhibit an improvement in performance over quantum well counterparts. Strained quantum wires are expected to have even better performance. However, not much is known about the true behavior of strain in actual structures, a parameter critical to their performance.

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