Research progresses of SOI optical waveguide devices and integrated optical switch matrix

2005 ◽  
Vol 48 (2) ◽  
pp. 234 ◽  
Author(s):  
Jinzhong YU
1998 ◽  
Vol 531 ◽  
Author(s):  
Hirotoshi Nagata ◽  
Naoki Mitsugi ◽  
Kaoru Higuma ◽  
Junichiro Ichikawa ◽  
Toshihiro Sakamoto ◽  
...  

AbstractIncreasing demands for LiNbO3 (LN) optical waveguide devices installed into submarine and terrestrial fiber communication systems necessitate that high quality and long-term reliability (over 20 years) be established. In addition to general requirements for reliability in electrooptical devices, the LN devices need to assure of the dc-drift phenomena in the optical output signal. The dc-drift is caused by the complex electrical nature of constituent device materials; i.e. LN substrates and SiO2 buffer layers on LN. Results of theoretical and experimental investigations of the suppression of dc-drift are applied to the design of practical LN devices, and the devices have been in service for 4 years, as of this moment, without any failure. Here, problems on the dc-drift are discussed from the viewpoints of device reliability and actual fabrication processes.


2001 ◽  
Author(s):  
Dali Liu ◽  
Gongyu Li ◽  
Xiaodong He ◽  
Guotong Du

1985 ◽  
Author(s):  
Richard F. Carson ◽  
Ted E. Batchman ◽  
Marta L. McWright

Optik ◽  
2021 ◽  
pp. 167734
Author(s):  
Hongru Zhang ◽  
Guofang Fan ◽  
Xiaoyu Cai ◽  
Jiasi Wei ◽  
Gaoshan Jing ◽  
...  

2001 ◽  
Vol 19 (8) ◽  
pp. 1169-1176 ◽  
Author(s):  
M.L.M. Balistreri ◽  
J.P. Korterik ◽  
L. Kiupers ◽  
N.F. van Hulst

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