Ultraviolet Optical Constants of Thin Films Determined by Reflectance Measurements

1970 ◽  
Vol 60 (4) ◽  
pp. 495 ◽  
Author(s):  
G. Baldini ◽  
L. Rigaldi
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Reflectance Measurements

Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements

1994 ◽  
Vol 33 (10) ◽  
pp. 2013 ◽  
Author(s):  
Jianlin Cao ◽  
Mihiro Yanagihara ◽  
Masaki Yamamoto ◽  
Yoshinori Goto ◽  
Takeshi Namioka
Keyword(s):  
Thin Films ◽  
Simultaneous Determination ◽  
Optical Constants ◽  
X Ray ◽  
Reflectance Measurements

VUV reflectance measurements and optical constants of SiC thin films

2005 ◽  
Vol 144-147 ◽  
pp. 987-992 ◽  
Author(s):  
P. Nicolosi ◽  
D. Garoli ◽  
M.-G. Pelizzo ◽  
V. Rigato ◽  
A. Patelli ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Reflectance Measurements

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

Optical constants of Sn-doped amorphous Ge-As-Te thin films and their physical characterization

2020 ◽  
Vol 583 ◽  
pp. 412066 ◽  
Author(s):  
Imed Boukhris ◽  
Imen Kebaili ◽  
Sami Znaidia ◽  
R. Neffati ◽  
H.H. Hegazy ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Physical Characterization
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