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Calculation of the Optical Constants of Amorphous Semiconducting As40s60, As40s35se25 and As40se60 Thin Films from Transmittance and Reflectance Measurements
Journal of Applied Sciences
◽
10.3923/jas.2006.340.346
◽
2006
◽
Vol 6
(2)
◽
pp. 340-346
◽
Cited By ~ 2
Author(s):
E.R. Shaaban
Keyword(s):
Thin Films
◽
Optical Constants
◽
Reflectance Measurements
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References
Ultraviolet Optical Constants of Thin Films Determined by Reflectance Measurements
Journal of the Optical Society of America
◽
10.1364/josa.60.000495
◽
1970
◽
Vol 60
(4)
◽
pp. 495
◽
Cited By ~ 15
Author(s):
G. Baldini
◽
L. Rigaldi
Keyword(s):
Thin Films
◽
Optical Constants
◽
Reflectance Measurements
Download Full-text
Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg_2Si, and InSb and of evaporated Cr
Applied Optics
◽
10.1364/ao.39.002772
◽
2000
◽
Vol 39
(16)
◽
pp. 2772
◽
Cited By ~ 24
Author(s):
Juan I. Larruquert
◽
Ritva A. M. Keski-Kuha
Keyword(s):
Thin Films
◽
Optical Constants
◽
Extreme Ultraviolet
◽
Ion Beam
◽
Reflectance Measurements
Download Full-text
Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements
Applied Optics
◽
10.1364/ao.33.002013
◽
1994
◽
Vol 33
(10)
◽
pp. 2013
◽
Cited By ~ 7
Author(s):
Jianlin Cao
◽
Mihiro Yanagihara
◽
Masaki Yamamoto
◽
Yoshinori Goto
◽
Takeshi Namioka
Keyword(s):
Thin Films
◽
Simultaneous Determination
◽
Optical Constants
◽
X Ray
◽
Reflectance Measurements
Download Full-text
Reflectance measurements and optical constants in the extreme ultraviolet of thin films of ion-beam-deposited carbon
Optics Communications
◽
10.1016/s0030-4018(00)00884-1
◽
2000
◽
Vol 183
(5-6)
◽
pp. 437-443
◽
Cited By ~ 14
Author(s):
Juan I Larruquert
◽
Ritva A.M Keski-Kuha
Keyword(s):
Thin Films
◽
Optical Constants
◽
Extreme Ultraviolet
◽
Ion Beam
◽
Reflectance Measurements
Download Full-text
Determination of the optical constants of thin films based on normal-incidence reflectance measurements
Journal of the Korean Physical Society
◽
10.3938/jkps.63.241
◽
2013
◽
Vol 63
(2)
◽
pp. 241-245
◽
Cited By ~ 2
Author(s):
S. Y. Hamh
◽
J. W. Han
◽
T. H. Kim
◽
J. S. Lee
Keyword(s):
Thin Films
◽
Optical Constants
◽
Normal Incidence
◽
Reflectance Measurements
Download Full-text
VUV reflectance measurements and optical constants of SiC thin films
Journal of Electron Spectroscopy and Related Phenomena
◽
10.1016/j.elspec.2005.01.248
◽
2005
◽
Vol 144-147
◽
pp. 987-992
◽
Cited By ~ 4
Author(s):
P. Nicolosi
◽
D. Garoli
◽
M.-G. Pelizzo
◽
V. Rigato
◽
A. Patelli
◽
...
Keyword(s):
Thin Films
◽
Optical Constants
◽
Reflectance Measurements
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Retraction notice to “Study of dielectric and optical constants of Benzobis(thiazole)-based copolymer thin films for designing optoelectronic devices”[Physica B 570 (2019) 6–12]
Physica B Condensed Matter
◽
10.1016/j.physb.2021.413053
◽
2021
◽
pp. 413053
Author(s):
L. Castañeda
Keyword(s):
Thin Films
◽
Optical Constants
◽
Optoelectronic Devices
◽
Retraction Notice
Download Full-text
Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry
Crystal Research and Technology
◽
10.1002/crat.200310094
◽
2003
◽
Vol 38
(9)
◽
pp. 773-778
◽
Cited By ~ 41
Author(s):
B. Karunagaran
◽
R. T. Rajendra Kumar
◽
C. Viswanathan
◽
D. Mangalaraj
◽
Sa. K. Narayandass
◽
...
Keyword(s):
Thin Films
◽
Titanium Dioxide
◽
Spectroscopic Ellipsometry
◽
Optical Constants
◽
Titanium Dioxide Thin Films
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Optical constants of Sn-doped amorphous Ge-As-Te thin films and their physical characterization
Physica B Condensed Matter
◽
10.1016/j.physb.2020.412066
◽
2020
◽
Vol 583
◽
pp. 412066
◽
Cited By ~ 1
Author(s):
Imed Boukhris
◽
Imen Kebaili
◽
Sami Znaidia
◽
R. Neffati
◽
H.H. Hegazy
◽
...
Keyword(s):
Thin Films
◽
Optical Constants
◽
Physical Characterization
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Corrigendum to “Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry” [Opt. Commun. 284(3), 807–812]•
Optics Communications
◽
10.1016/j.optcom.2011.03.070
◽
2011
◽
Vol 284
(12)
◽
pp. 3181
Keyword(s):
Thin Films
◽
Spectroscopic Ellipsometry
◽
Vanadium Dioxide
◽
Optical Constants
◽
Vanadium Dioxide Thin Films
Download Full-text
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