Determination of the optical constants of thin films based on normal-incidence reflectance measurements

2013 ◽  
Vol 63 (2) ◽  
pp. 241-245 ◽  
Author(s):  
S. Y. Hamh ◽  
J. W. Han ◽  
T. H. Kim ◽  
J. S. Lee
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Normal Incidence ◽  
Reflectance Measurements

Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements

1994 ◽  
Vol 33 (10) ◽  
pp. 2013 ◽  
Author(s):  
Jianlin Cao ◽  
Mihiro Yanagihara ◽  
Masaki Yamamoto ◽  
Yoshinori Goto ◽  
Takeshi Namioka
Keyword(s):  
Thin Films ◽  
Simultaneous Determination ◽  
Optical Constants ◽  
X Ray ◽  
Reflectance Measurements

Determination of the Optical Constants of Thin Films Using Photoacoustic Spectroscopy

1981 ◽  
Vol 20 (9) ◽  
pp. L665-L668 ◽  
Author(s):  
Satoshi Yamasaki ◽  
Hideyo Okushi ◽  
Akihisa Matsuda ◽  
Hidetoshi Oheda ◽  
Nobuhiro Hata ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoacoustic Spectroscopy ◽  
Optical Constants

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination
Sign in / Sign up

Export Citation Format

Share Document