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Reflectance measurements and optical constants in the extreme ultraviolet of thin films of ion-beam-deposited carbon
Optics Communications
◽
10.1016/s0030-4018(00)00884-1
◽
2000
◽
Vol 183
(5-6)
◽
pp. 437-443
◽
Cited By ~ 14
Author(s):
Juan I Larruquert
◽
Ritva A.M Keski-Kuha
Keyword(s):
Thin Films
◽
Optical Constants
◽
Extreme Ultraviolet
◽
Ion Beam
◽
Reflectance Measurements
Download Full-text
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References
Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg_2Si, and InSb and of evaporated Cr
Applied Optics
◽
10.1364/ao.39.002772
◽
2000
◽
Vol 39
(16)
◽
pp. 2772
◽
Cited By ~ 24
Author(s):
Juan I. Larruquert
◽
Ritva A. M. Keski-Kuha
Keyword(s):
Thin Films
◽
Optical Constants
◽
Extreme Ultraviolet
◽
Ion Beam
◽
Reflectance Measurements
Download Full-text
Calculation of the Optical Constants of Amorphous Semiconducting As40s60, As40s35se25 and As40se60 Thin Films from Transmittance and Reflectance Measurements
Journal of Applied Sciences
◽
10.3923/jas.2006.340.346
◽
2006
◽
Vol 6
(2)
◽
pp. 340-346
◽
Cited By ~ 2
Author(s):
E.R. Shaaban
Keyword(s):
Thin Films
◽
Optical Constants
◽
Reflectance Measurements
Download Full-text
Ultraviolet Optical Constants of Thin Films Determined by Reflectance Measurements
Journal of the Optical Society of America
◽
10.1364/josa.60.000495
◽
1970
◽
Vol 60
(4)
◽
pp. 495
◽
Cited By ~ 15
Author(s):
G. Baldini
◽
L. Rigaldi
Keyword(s):
Thin Films
◽
Optical Constants
◽
Reflectance Measurements
Download Full-text
Fabrication and optical constants of amorphous copper nitride thin films prepared by ion beam assisted dc magnetron reactive sputtering
Journal of Alloys and Compounds
◽
10.1016/j.jallcom.2006.12.020
◽
2008
◽
Vol 454
(1-2)
◽
pp. 102-105
◽
Cited By ~ 21
Author(s):
I.M. Odeh
Keyword(s):
Thin Films
◽
Optical Constants
◽
Ion Beam
◽
Reactive Sputtering
◽
Copper Nitride
◽
Dc Magnetron Reactive Sputtering
Download Full-text
Extreme ultraviolet optical properties of ion-beam-deposited boron carbide thin films
10.1117/12.212622
◽
1995
◽
Cited By ~ 6
Author(s):
Gerry M. Blumenstock
◽
Ritva A. M. Keski-Kuha
◽
Marshal L. Ginter
Keyword(s):
Thin Films
◽
Optical Properties
◽
Boron Carbide
◽
Extreme Ultraviolet
◽
Ion Beam
Download Full-text
Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements
Applied Optics
◽
10.1364/ao.33.002013
◽
1994
◽
Vol 33
(10)
◽
pp. 2013
◽
Cited By ~ 7
Author(s):
Jianlin Cao
◽
Mihiro Yanagihara
◽
Masaki Yamamoto
◽
Yoshinori Goto
◽
Takeshi Namioka
Keyword(s):
Thin Films
◽
Simultaneous Determination
◽
Optical Constants
◽
X Ray
◽
Reflectance Measurements
Download Full-text
Reflectance measurements and optical constants in the extreme ultraviolet-vacuum ultraviolet regions for SiC with a different C/Si ratio
Applied Optics
◽
10.1364/ao.45.005642
◽
2006
◽
Vol 45
(22)
◽
pp. 5642
◽
Cited By ~ 17
Author(s):
Denis Garoli
◽
F. Frassetto
◽
G. Monaco
◽
P. Nicolosi
◽
M.-G. Pelizzo
◽
...
Keyword(s):
Optical Constants
◽
Vacuum Ultraviolet
◽
Extreme Ultraviolet
◽
Reflectance Measurements
Download Full-text
Determination of the optical constants of thin films based on normal-incidence reflectance measurements
Journal of the Korean Physical Society
◽
10.3938/jkps.63.241
◽
2013
◽
Vol 63
(2)
◽
pp. 241-245
◽
Cited By ~ 2
Author(s):
S. Y. Hamh
◽
J. W. Han
◽
T. H. Kim
◽
J. S. Lee
Keyword(s):
Thin Films
◽
Optical Constants
◽
Normal Incidence
◽
Reflectance Measurements
Download Full-text
VUV reflectance measurements and optical constants of SiC thin films
Journal of Electron Spectroscopy and Related Phenomena
◽
10.1016/j.elspec.2005.01.248
◽
2005
◽
Vol 144-147
◽
pp. 987-992
◽
Cited By ~ 4
Author(s):
P. Nicolosi
◽
D. Garoli
◽
M.-G. Pelizzo
◽
V. Rigato
◽
A. Patelli
◽
...
Keyword(s):
Thin Films
◽
Optical Constants
◽
Reflectance Measurements
Download Full-text
Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet–soft-x-ray region
Applied Optics
◽
10.1364/ao.36.005499
◽
1997
◽
Vol 36
(22)
◽
pp. 5499
◽
Cited By ~ 67
Author(s):
Regina Soufli
◽
Eric M. Gullikson
Keyword(s):
Optical Constants
◽
Extreme Ultraviolet
◽
X Ray
◽
Reflectance Measurements
Download Full-text
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