Multinodal fifth-order optical aberrations of optical systems without rotational symmetry: the comatic aberrations

2010 ◽  
Vol 27 (6) ◽  
pp. 1490 ◽  
Author(s):  
Kevin P. Thompson
Keyword(s):  
Rotational Symmetry ◽  
Optical Systems ◽  
Optical Aberrations ◽  
Fifth Order

Fifth-order Aberration Coefficients for Plane-symmetric Optical Systems

2021 ◽  
Author(s):  
Yuxuan Liu ◽  
Jessica Steidle ◽  
Jannick P. Rolland
Keyword(s):  
Optical Systems ◽  
Plane Symmetric ◽  
Fifth Order

The geometrical aberrations of general electron optical systems II. The primary (third order) aberrations of orthogonal systems, and the secondary (fifth order) aberrations of round systems

1965 ◽  
Vol 257 (1086) ◽  
pp. 523-552 ◽  
Keyword(s):  
Second Order ◽  
Order Perturbation ◽  
Optical Systems ◽  
Characteristic Functions ◽  
Electron Optics ◽  
Third Order ◽  
Variation Of Parameters ◽  
General Kind ◽  
Fifth Order ◽  
Orthogonal Systems

The theory of characteristic functions, developed by Sturrock for electron optics, is used to calculate the primary aberrations of rectilinear orthogonal systems of the most general kind. In the second part, the secondary aberrations of round systems are calculated with the aid of Sturrock’s second-order perturbation characteristic functions. A proof of the equivalence of the aberration formulae obtained by Melkich, using the variation of parameters method, and those obtained below is offered in an appendix.

MODELING AND PERFORMANCE EVALUATION OF OPTICAL SYSTEMS USING SKEW RAY TRACING

2007 ◽  
Vol 31 (2) ◽  
pp. 143-156
Author(s):  
Te-Tan Liao ◽  
Jing-Fung Lin
Keyword(s):  
Ray Tracing ◽  
Optical System ◽  
Monochromatic Light ◽  
Merit Function ◽  
Optical Systems ◽  
Optical Aberrations ◽  
Algebra Approach ◽  
Homogeneous Transformation Matrix ◽  
Overall Performance ◽  
And Performance

This paper applies a computational geometric algebra approach based on a 4 x 4 homogeneous transformation matrix to model optical systems and to evaluate their performance. In the proposed approach, the directions of the refracted/reflected rays at each boundary in the optical system are determined using skew ray tracing based upon Snell’s law. The differential changes in the image coordinates caused by optical aberrations are derived for both polychromatic and monochromatic light by applying a sensitivity analysis approach. Finally, a merit function is constructed comprising five individual defect items in order to evaluate the overall performance of a generic optical system. The proposed analytical approach provides a comprehensive and robust approach for the modeling and evaluation of optical systems.

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