Applicability of rotationally sheering interferometers to the testing of the optical systems without rotational symmetry

Author(s):  
Marija S. Scholl

It is well known that the aberrations of optical systems due to such disturbances as chromatic variation may be treated by perturbation methods; it is also true that the calculation of geometrical aberrations may be interpreted as a perturbation problem. The perturbation concept is therefore adopted in the present paper which attempts to systematize and extend to higher orders the aberration theory of electron optics. Hamilton’s ‘equation of the characteristic function’ is derived in the usual way from the variational equation for an unperturbed system. It is then assumed that the variational function, i. e. the integrand of the variational equation, depends on a ‘perturbation parameter’ and the corresponding perturbations of Hamilton’s point characteristic function and of Hamilton’s differential relation are obtained. The first-order terms, when separated, lead to the introduction of a pair of characteristic functions whose arguments may be—among other choices—the co-ordinates in the object and aperture surfaces; from these one may obtain the perturbation of the ray throughout its length. The perturbation of rays at a surface which is an image surface of the unperturbed system may be derived from a single characteristic function. Formulae simplify considerably if the unperturbed system is Gaussian or otherwise orthogonal. It is found that there exist two distinct pairs of second-order characteristic functions; this duality offers a means of checking second-order calculations. Once again, perturbations at an image surface may be evaluated from a single characteristic function. When calculations are taken beyond the first order, it is necessary to consider more than one parameter, since perturbation effects are then no longer additive. The theory is used to establish formulae for the geometrical, chromatic and mixed aberrations of two classes of systems; one contains all systems of rotational symmetry, the other all systems with curved axes. There are three appendices, the first giving certain transformations which may be applied to the perturbations of a variational function, the second discussing the use of complex co-ordinates, and the third giving a classification of electron-optical systems according to their aberration calculations. Although the theory is developed only to the second order, the extension to higher orders is straightforward.


Author(s):  
L. Reimer ◽  
R. Oelgeklaus

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.


Author(s):  
J T Fourie

The attempts at improvement of electron optical systems to date, have largely been directed towards the design aspect of magnetic lenses and towards the establishment of ideal lens combinations. In the present work the emphasis has been placed on the utilization of a unique three-dimensional crystal objective aperture within a standard electron optical system with the aim to reduce the spherical aberration without introducing diffraction effects. A brief summary of this work together with a description of results obtained recently, will be given.The concept of utilizing a crystal as aperture in an electron optical system was introduced by Fourie who employed a {111} crystal foil as a collector aperture, by mounting the sample directly on top of the foil and in intimate contact with the foil. In the present work the sample was mounted on the bottom of the foil so that the crystal would function as an objective or probe forming aperture. The transmission function of such a crystal aperture depends on the thickness, t, and the orientation of the foil. The expression for calculating the transmission function was derived by Hashimoto, Howie and Whelan on the basis of the electron equivalent of the Borrmann anomalous absorption effect in crystals. In Fig. 1 the functions for a g220 diffraction vector and t = 0.53 and 1.0 μm are shown. Here n= Θ‒ΘB, where Θ is the angle between the incident ray and the (hkl) planes, and ΘB is the Bragg angle.


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