Hyperfine structure intensity measurements as a tool for quadrupole radial integral determination

1984 ◽  
Vol 1 (1) ◽  
pp. 48 ◽  
Author(s):  
Jozef Heldt ◽  
Tomasz Gil ◽  
Stanislaw Zachara ◽  
Malcom Hults
Keyword(s):  
Hyperfine Structure ◽  
Radial Integral ◽  
Intensity Measurements

Thickness and composition determinations from T.E.M. specimens using both x-ray and backscattered electron data

1984 ◽  
Vol 42 ◽  
pp. 576-577
Author(s):  
M.D. Ball ◽  
H. Lagace ◽  
M.C. Thornton
Keyword(s):  
Electron Microscope ◽  
Atomic Number ◽  
Transmission Electron Microscope ◽  
Convenient Method ◽  
Flow Chart ◽  
X Ray ◽  
Intensity Measurements ◽  
Transmission Electron ◽  
Electron Intensity ◽  
Backscattered Electron

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.

Influence of the hyperfine structure on the time-dependence of Mössbauer transmission

1985 ◽  
Vol 46 (8) ◽  
pp. 1387-1393 ◽  
Author(s):  
D.L. Balabanski ◽  
E.I. Vapirev ◽  
P.S. Kamenov
Keyword(s):  
Time Dependence ◽  
Hyperfine Structure
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