Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates by Low Coherence Interferometry - Proposal and Demonstration -

Author(s):  
M. Ohmi ◽  
T. Shiraishi ◽  
H. Tajiri ◽  
M. Haruna
1997 ◽  
Vol 4 (4) ◽  
pp. 507-515 ◽  
Author(s):  
Masato Ohmi ◽  
Takehisa Shiraishi ◽  
Hideyuki Tajiri ◽  
Masamitsu Haruna

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