White-light scanning fiber Michelson interferometer for absolute position–distance measurement

1995 ◽  
Vol 20 (7) ◽  
pp. 785 ◽  
Author(s):  
Tianchu Li ◽  
Anbo Wang ◽  
Kent Murphy ◽  
Richard Claus
1971 ◽  
Vol 49 (17) ◽  
pp. 2237-2249 ◽  
Author(s):  
C. Delisle ◽  
M. Brochu ◽  
J. M. St-Arnaud

The visibility of the channelled spectrum, or in other words the visibility of the spectral density modulation at the exit of a Michelson interferometer illuminated with a parallel beam of white light, is theoretically independent of the frequency and path difference of the two beams formed in the interferometer. Up to now there has been no agreement between theory and experiment. It is shown here, theoretically and experimentally, that the decrease in visibility with increasing path difference is related to both the finite size of the slits and the limit of resolution of the apparatus.


2009 ◽  
Vol 282 (9) ◽  
pp. 1837-1840 ◽  
Author(s):  
Kun-Huang Chen ◽  
Jing-Heng Chen ◽  
Shen-Hua Lu ◽  
Wei-Yao Chang ◽  
Chi-Chang Wu

2015 ◽  
Vol 119 (2) ◽  
pp. 347-353 ◽  
Author(s):  
Keisuke Kaneshima ◽  
Muneo Sugiura ◽  
Koichi Tamura ◽  
Nobuhisa Ishii ◽  
Jiro Itatani

2000 ◽  
Vol 77 (9) ◽  
pp. 685-692
Author(s):  
C Lupi ◽  
E Tanguy ◽  
C Boisrobert ◽  
F de Fornel

We report on low-coherence, near-infrared reflectometry applied to optical fibres, waveguides, and coupling devices to detect the echoes due to reflective propagation defects and measure their optical properties — losses or attenuation, dispersion. This technique, based on interferometry, leads to the highest spatial resolution and the lowest detectable reflected optical power. We scan the reference arm of our Michelson interferometer around the ``white light fringe'' position and obtain interferograms whose envelopes and fringes contain information on the light source spectrum and the reflectivity of the test arm. Theoretical and experimental results are compared. Examples are given and show that numerical simulations are needed to understand the signatures of the reflectors and get to their physical structures.


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