scholarly journals Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure

2009 ◽  
Vol 34 (17) ◽  
pp. 2661 ◽  
Author(s):  
Petr Hlubina ◽  
Dalibor Ciprian ◽  
Jiri Lunacek
Keyword(s):  
Thin Film ◽  
Film Structure ◽  
Interferometric Technique ◽  
Thin Film Structure

OPTIMIZATION OF THIN FILM STRUCTURE Ge2Sb2Te5 FOR OPTICAL SWITCHES

2018 ◽  
Vol 66-2 ◽  
pp. 2-8 ◽  
Author(s):  
N. V. Vishnyakov ◽  
◽  
N. M. Tolkach ◽  
P. S. Provotorov ◽  
◽  
...  
Keyword(s):  
Thin Film ◽  
Film Structure ◽  
Optical Switches ◽  
Thin Film Structure

Influence of the energy parameters of the deposited laser-induced flow of platinum atoms on characteristics of a Pt/n-6H-SiC thin-film structure

2010 ◽  
Vol 44 (4) ◽  
pp. 537-543 ◽  
Author(s):  
V. Yu. Fominskii ◽  
R. I. Romanov ◽  
A. G. Gnedovets ◽  
V. V. Zuev ◽  
M. V. Demin
Keyword(s):  
Thin Film ◽  
Film Structure ◽  
Thin Film Structure ◽  
Energy Parameters ◽  
Induced Flow
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