scholarly journals Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure

2009 ◽  
Vol 34 (17) ◽  
pp. 2661 ◽  
Author(s):  
Petr Hlubina ◽  
Dalibor Ciprian ◽  
Jiri Lunacek
Author(s):  
N. V. Vishnyakov ◽  
◽  
N. M. Tolkach ◽  
P. S. Provotorov ◽  
◽  
...  

2010 ◽  
Vol 44 (4) ◽  
pp. 537-543 ◽  
Author(s):  
V. Yu. Fominskii ◽  
R. I. Romanov ◽  
A. G. Gnedovets ◽  
V. V. Zuev ◽  
M. V. Demin

2002 ◽  
Vol 80 (10) ◽  
pp. 1716-1718 ◽  
Author(s):  
Eric Irissou ◽  
Boris Le Drogoff ◽  
Mohamed Chaker ◽  
Daniel Guay

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