Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure
2009 ◽
Vol 34
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pp. 2661
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Petr Hlubina
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Dalibor Ciprian
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Jiri Lunacek
2010 ◽
Vol 101
(4)
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pp. 869-873
P. Hlubina
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D. Ciprian
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J. Luňáček
2010 ◽
Vol 283
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pp. 4877-4881
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P. Hlubina
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J. Luňáček
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D. Ciprian
2018 ◽
Vol 66-2
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pp. 2-8
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N. V. Vishnyakov
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N. M. Tolkach
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P. S. Provotorov
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...
Savita Sharma
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Anjali Sharma
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Vinay Gupta
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Nitin K. Puri
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Monika Tomar
2018 ◽
Vol 5
(3)
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pp. 9935-9940
Amrita Ghosh
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Sk Taheruddin Ahamed
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Anup Mondal
1969 ◽
Vol 40
(13)
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pp. 5179-5184
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1977 ◽
Vol 27
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pp. 345-347
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2010 ◽
Vol 44
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pp. 537-543
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V. Yu. Fominskii
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R. I. Romanov
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A. G. Gnedovets
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V. V. Zuev
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M. V. Demin
2016 ◽
Vol 30
(4)
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pp. 1547-1554
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Myung-Soo Shin
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Jun-Hyub Park
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Jung Yup Kim
2002 ◽
Vol 80
(10)
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pp. 1716-1718
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Eric Irissou
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Boris Le Drogoff
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Mohamed Chaker
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Daniel Guay