Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure
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2010 ◽
Vol 283
(24)
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pp. 4877-4881
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1989 ◽
Vol 47
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pp. 574-575
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2018 ◽
Vol 66-2
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pp. 2-8
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2016 ◽
Vol 30
(4)
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pp. 1547-1554
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