TOF-SIMS Analysis by Means of Cluster Ion Beam
2018 ◽
Vol 61
(7)
◽
pp. 435-439
2019 ◽
Vol 40
(9)
◽
pp. 877-881
◽
Sang Ju Lee
◽
Chang Min Choi
◽
Boo Ki Min
◽
Ji Young Baek
◽
Jae Yeong Eo
◽
...
2019 ◽
Vol 448
◽
pp. 11-18
P. Thopan
◽
T. Seki
◽
L.D. Yu
◽
U. Tippawan
◽
J. Matsuo
2018 ◽
Vol 458
◽
pp. 805-809
◽
Chang Min Choi
◽
Sang Ju Lee
◽
Ji Young Baek
◽
Jeong Jin Kim
◽
Myoung Choul Choi
2014 ◽
Vol 46
(S1)
◽
pp. 344-347
◽
Akiya Karen
◽
Kimihiko Ito
◽
Yoshimi Kubo
2014 ◽
Vol 46
(S1)
◽
pp. 100-104
◽
S. Nishinomiya
◽
K. Toshin
◽
S. Hayashi
◽
K. Iuchi
◽
N. Se
◽
...
2016 ◽
Vol 11
(2)
◽
pp. 02A305
◽
Ricarda Nees
◽
Andreas Pelster
◽
Martin Körsgen
◽
Harald Jungnickel
◽
Andreas Luch
◽
...
2020 ◽
Vol 15
(2)
◽
pp. 021011
◽
Jin Gyeong Son
◽
Sohee Yoon
◽
Hyun Kyung Shon
◽
Jeong Hee Moon
◽
Sunho Joh
◽
...
2006 ◽
Vol 252
(19)
◽
pp. 6619-6623
◽
Zhengmao Zhu
◽
Michael J. Kelley
2019 ◽
Vol 450
◽
pp. 139-143
P. Thopan
◽
T. Seki
◽
L.D. Yu
◽
U. Tippawan
◽
J. Matsuo
2014 ◽
Vol 46
(S1)
◽
pp. 189-192
◽
Hyun Kyong Shon
◽
Young-Lai Cho
◽
Choung Su Lim
◽
Joon Sig Choi
◽
Sang J. Chung
◽
...