ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis
Bulletin of the Korean Chemical Society
◽
10.1002/bkcs.11840
◽
2019
◽
Vol 40
(9)
◽
pp. 877-881
◽
Cited By ~ 4
Author(s):
Sang Ju Lee
◽
Chang Min Choi
◽
Boo Ki Min
◽
Ji Young Baek
◽
Jae Yeong Eo
◽
...
Keyword(s):
Ion Beam
◽
Argon Gas
◽
Tof Sims
◽
Cluster Ion
◽
Sims Analysis
◽
Gas Cluster Ion Beam
Download Full-text
Related Documents
Cited By
References
ToF-SIMS of OLED materials using argon gas cluster ion Beam: A promising approach for OLED inspection
Applied Surface Science
◽
10.1016/j.apsusc.2019.144887
◽
2020
◽
Vol 507
◽
pp. 144887
◽
Cited By ~ 1
Author(s):
Ji Young Baek
◽
Chang Min Choi
◽
Sang Ju Lee
◽
Boo Ki Min
◽
Hwa Seung Kang
◽
...
Keyword(s):
Ion Beam
◽
Argon Gas
◽
Tof Sims
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
TOF-SIMS analysis of lithium air battery discharge products utilizing gas cluster ion beam sputtering for surface stabilization
Surface and Interface Analysis
◽
10.1002/sia.5508
◽
2014
◽
Vol 46
(S1)
◽
pp. 344-347
◽
Cited By ~ 4
Author(s):
Akiya Karen
◽
Kimihiko Ito
◽
Yoshimi Kubo
Keyword(s):
Ion Beam
◽
Ion Beam Sputtering
◽
Surface Stabilization
◽
Tof Sims
◽
Beam Sputtering
◽
Cluster Ion
◽
Air Battery
◽
Sims Analysis
◽
Gas Cluster Ion Beam
◽
Battery Discharge
Download Full-text
Argon Gas Cluster Ion Beam for Practical Surface Analysis
Journal of the Vacuum Society of Japan
◽
10.3131/jvsj2.59.134
◽
2016
◽
Vol 59
(5)
◽
pp. 134-137
Author(s):
Takuya MIYAYAMA
Keyword(s):
Surface Analysis
◽
Ion Beam
◽
Argon Gas
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry
Journal of the Vacuum Society of Japan
◽
10.3131/jvsj2.56.348
◽
2013
◽
Vol 56
(9)
◽
pp. 348-354
◽
Cited By ~ 2
Author(s):
Takuya MIYAYAMA
Keyword(s):
Mass Spectrometry
◽
Photoelectron Spectroscopy
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Argon Gas
◽
X Ray
◽
Practical Applications
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
Download Full-text
XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam
Biointerphases
◽
10.1116/1.4948341
◽
2016
◽
Vol 11
(2)
◽
pp. 029603
◽
Cited By ~ 2
Author(s):
Paul M. Dietrich
◽
Carolin Nietzold
◽
Matthias Weise
◽
Wolfgang E. S. Unger
◽
Saad Alnabulsi
◽
...
Keyword(s):
Ion Beam
◽
Depth Profiling
◽
Argon Gas
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Argon gas cluster ion beam used to identify intact proteins through enzymatic digestion
Scilight
◽
10.1063/10.0001153
◽
2020
◽
Vol 2020
(16)
◽
pp. 161106
Author(s):
Jodi Ackerman Frank
Keyword(s):
Ion Beam
◽
Enzymatic Digestion
◽
Argon Gas
◽
Intact Proteins
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
TOF-SIMS study of polyester/melamine resin with Ar gas cluster ion beam
Surface and Interface Analysis
◽
10.1002/sia.5613
◽
2014
◽
Vol 46
(S1)
◽
pp. 100-104
◽
Cited By ~ 2
Author(s):
S. Nishinomiya
◽
K. Toshin
◽
S. Hayashi
◽
K. Iuchi
◽
N. Se
◽
...
Keyword(s):
Ion Beam
◽
Melamine Resin
◽
Tof Sims
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Ar Gas
Download Full-text
Ar-gas cluster ion beam in ToF-SIMS for peptide and protein analysis
Biointerphases
◽
10.1116/6.0000105
◽
2020
◽
Vol 15
(2)
◽
pp. 021011
◽
Cited By ~ 3
Author(s):
Jin Gyeong Son
◽
Sohee Yoon
◽
Hyun Kyung Shon
◽
Jeong Hee Moon
◽
Sunho Joh
◽
...
Keyword(s):
Ion Beam
◽
Protein Analysis
◽
Tof Sims
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Ar Gas
Download Full-text
Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry
Surface and Interface Analysis
◽
10.1002/sia.5518
◽
2014
◽
Vol 46
(12-13)
◽
pp. 1129-1132
Author(s):
Makiko Fujii
◽
Shunichirou Nakagawa
◽
Toshio Seki
◽
Takaaki Aoki
◽
Jiro Matsuo
Keyword(s):
Mass Spectrometry
◽
Quantitative Analysis
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Argon Gas
◽
Ion Mass Spectrometry
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
Download Full-text
Gas cooling secondary ions emitted by gas cluster ion beam at the travelling-wave ion guide of a Q-ToF-SIMS system
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
◽
10.1016/j.nimb.2018.07.024
◽
2019
◽
Vol 450
◽
pp. 139-143
Author(s):
P. Thopan
◽
T. Seki
◽
L.D. Yu
◽
U. Tippawan
◽
J. Matsuo
Keyword(s):
Ion Beam
◽
Travelling Wave
◽
Ion Guide
◽
Tof Sims
◽
Secondary Ions
◽
Gas Cooling
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close