ToF–SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source

2006 ◽  
Vol 252 (19) ◽  
pp. 6619-6623 ◽  
Author(s):  
Zhengmao Zhu ◽  
Michael J. Kelley
Keyword(s):  
Gold Cluster ◽  
Ion Source ◽  
Tof Sims ◽  
Cluster Ion Source ◽  
Cluster Ion ◽  
Sims Analysis

Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

2006 ◽  
Vol 252 (19) ◽  
pp. 6547-6549 ◽  
Author(s):  
K. Aimoto ◽  
S. Aoyagi ◽  
N. Kato ◽  
N. Iida ◽  
A. Yamamoto ◽  
...  
Keyword(s):  
Polymer Material ◽  
Gold Cluster ◽  
Ion Source ◽  
Yield Enhancement ◽  
Tof Sims ◽  
Cluster Ion Source ◽  
Cluster Ion ◽  
Secondary Ion

ToF-SIMS depth profiling of organic solar cell layers using an Ar cluster ion source

2013 ◽  
Vol 31 (3) ◽  
pp. 030601 ◽  
Author(s):  
Vincent S. Smentkowski ◽  
Gilad Zorn ◽  
Amanda Misner ◽  
Gautam Parthasarathy ◽  
Aaron Couture ◽  
...  
Keyword(s):  
Solar Cell ◽  
Organic Solar Cell ◽  
Depth Profiling ◽  
Ion Source ◽  
Tof Sims ◽  
Cluster Ion Source ◽  
Cell Layers ◽  
Cluster Ion ◽  
Sims Depth Profiling

Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis

2019 ◽  
Vol 40 (9) ◽  
pp. 877-881 ◽  
Author(s):  
Sang Ju Lee ◽  
Chang Min Choi ◽  
Boo Ki Min ◽  
Ji Young Baek ◽  
Jae Yeong Eo ◽  
...  
Keyword(s):  
Ion Beam ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion ◽  
Sims Analysis ◽  
Gas Cluster Ion Beam

Multipole Ion Trap as Cluster-Ion Source

2007 ◽  
Vol 46 (7A) ◽  
pp. 4312-4317
Author(s):  
Noriyuki Uchida ◽  
Yuji Ohishi ◽  
Tomonari Sho ◽  
Kaoru Kimura ◽  
Toshihiko Kanayama
Keyword(s):  
Ion Trap ◽  
Ion Source ◽  
Cluster Ion Source ◽  
Cluster Ion

Production, Characterization, and Deposition of Carbon Clusters

1990 ◽  
Vol 206 ◽  
Author(s):  
Y. K. Bae ◽  
D. C. Lorents ◽  
R. Malhotra ◽  
C. H. Becker ◽  
D. Tse ◽  
...  
Keyword(s):  
High Temperatures ◽  
Thermal Desorption ◽  
Size Range ◽  
Ion Source ◽  
Carbon Clusters ◽  
Heating Process ◽  
Cluster Ion Source ◽  
Semiconductor Clusters ◽  
Cluster Ion ◽  
Wide Size Range

ABSTRACTWe have developed a new cluster ion source that can generate intense beams of metal and semiconductor clusters of a very wide-size range. With the source, we have observed intense beams of carbon clusters with mean cluster sizes of up to 4000 atoms/clusters. However, we have found that for generating small fullerenes, such as C60 and C70, the recently discovered technique by Kraetschmer et al. is much more efficient. By improving the technique, we have generated gram quantities of C60 and C70 and systematically investigated their thermal desorption properties. During the heating process, we have discovered that at high temperatures the bulk fullerenes, fullerite, transformed to another form of carbon, which still evaporates at temperatures above 700 C, but does not dissolve in benzene.

Vapourized-Metal Cluster Ion Source for Ion Plating

1974 ◽  
Vol 13 (S1) ◽  
pp. 427 ◽  
Author(s):  
Toshinori Takagi ◽  
Isao Yamada ◽  
Kouichi Yanagawa ◽  
Masatoshi Kunori ◽  
Shigemitsu Kobiyama
Keyword(s):  
Metal Cluster ◽  
Ion Source ◽  
Ion Plating ◽  
Cluster Ion Source ◽  
Cluster Ion

VUV-photoelectron spectroscopy on lead clusters deposited from the pulsed arc cluster ion source (PACIS)

1993 ◽  
Vol 90 (2) ◽  
pp. 201-206 ◽  
Author(s):  
H. R. Siekmann ◽  
E. Holub-Krappe ◽  
Bu. Wrenger ◽  
Ch. Pettenkofer ◽  
K. H. Meiwes-Broer
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Source ◽  
Cluster Ion Source ◽  
Cluster Ion ◽  
Pulsed Arc

scholarly journals Deposition of mass-selected cluster ions using a pulsed arc cluster-ion source

2001 ◽  
Vol 73 (5) ◽  
pp. 547-554 ◽  
Author(s):  
B. Klipp ◽  
M. Grass ◽  
J. Müller ◽  
D. Stolcic ◽  
U. Lutz ◽  
...  
Keyword(s):  
Ion Source ◽  
Cluster Ions ◽  
Cluster Ion Source ◽  
Cluster Ion ◽  
Pulsed Arc
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