ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
gas cluster ion beam
Recently Published Documents
TOTAL DOCUMENTS
220
(FIVE YEARS 34)
H-INDEX
19
(FIVE YEARS 4)
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Characteristics of a mixed-gas cluster ion beam for time-of-flight secondary ion mass spectrometry
Applied Surface Science
◽
10.1016/j.apsusc.2021.151467
◽
2022
◽
Vol 572
◽
pp. 151467
Author(s):
Sang Ju Lee
◽
Aram Hong
◽
Jinwan Cho
◽
Chang Min Choi
◽
Ji Young Baek
◽
...
Keyword(s):
Mass Spectrometry
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Time Of Flight
◽
Mixed Gas
◽
Ion Mass Spectrometry
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
Download Full-text
Ar gas cluster ion beam assisted XPS study of LiNbO3 Z cut surface
Surfaces and Interfaces
◽
10.1016/j.surfin.2021.101428
◽
2021
◽
pp. 101428
Author(s):
E.A. Skryleva
◽
B.R. Senatulin
◽
D.A. Kiselev
◽
T.S. Ilina
◽
D.A. Podgorny
◽
...
Keyword(s):
Ion Beam
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Ar Gas
◽
Xps Study
◽
Cut Surface
Download Full-text
Multiomics Imaging Using High-Energy Water Gas Cluster Ion Beam Secondary Ion Mass Spectrometry [(H2O)n-GCIB-SIMS] of Frozen-Hydrated Cells and Tissue
Analytical Chemistry
◽
10.1021/acs.analchem.0c05210
◽
2021
◽
Author(s):
Hua Tian
◽
Sadia Sheraz née Rabbani
◽
John C. Vickerman
◽
Nicholas Winograd
Keyword(s):
Mass Spectrometry
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
High Energy
◽
Ion Mass Spectrometry
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Water Gas
◽
Secondary Ion
Download Full-text
Gas Cluster Ion Beam Cleaning of CVD-Grown Graphene for Use in Electronic Device Fabrication
ACS Applied Nano Materials
◽
10.1021/acsanm.1c00519
◽
2021
◽
Author(s):
Barry Brennan
◽
Alba Centeno
◽
Amaia Zurutuza
◽
Paul Mack
◽
Keith R. Paton
◽
...
Keyword(s):
Electronic Device
◽
Ion Beam
◽
Device Fabrication
◽
Cluster Ion
◽
Grown Graphene
◽
Gas Cluster Ion Beam
◽
Electronic Device Fabrication
Download Full-text
Surface analysis by gas cluster ion beam XPS and ToF-SIMS tandem MS of 2-mercaptobenzoxazole corrosion inhibitor for brass
Corrosion Science
◽
10.1016/j.corsci.2021.109269
◽
2021
◽
Vol 182
◽
pp. 109269
Author(s):
Matjaž Finšgar
Keyword(s):
Corrosion Inhibitor
◽
Surface Analysis
◽
Ion Beam
◽
Tandem Ms
◽
Tof Sims
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Direct Mapping of Phospholipid Ferroptotic Death Signals in Cells and Tissues by Gas Cluster Ion Beam Secondary Ion Mass Spec‐trometry (GCIB‐SIMS)
Angewandte Chemie
◽
10.1002/ange.202102001
◽
2021
◽
Author(s):
Louis Sparvero
◽
Hua Tian
◽
Andrew A. Amoscato
◽
Wan-Yang Sun
◽
Tamil S. Anthonymuthu
◽
...
Keyword(s):
Ion Beam
◽
Direct Mapping
◽
Mass Spec
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
◽
Death Signals
◽
In Cells
Download Full-text
Direct Mapping of Phospholipid Ferroptotic Death Signals in Cells and Tissues by Gas Cluster Ion Beam Secondary Ion Mass Spec‐trometry (GCIB‐SIMS)
Angewandte Chemie International Edition
◽
10.1002/anie.202102001
◽
2021
◽
Author(s):
Louis Sparvero
◽
Hua Tian
◽
Andrew A. Amoscato
◽
Wan-Yang Sun
◽
Tamil S. Anthonymuthu
◽
...
Keyword(s):
Ion Beam
◽
Direct Mapping
◽
Mass Spec
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
◽
Death Signals
◽
In Cells
Download Full-text
Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application In Situ Matrix-Enhanced Secondary Ion Mass Spectrometry
Analytical Chemistry
◽
10.1021/acs.analchem.0c04680
◽
2021
◽
Vol 93
(7)
◽
pp. 3436-3444
Author(s):
Matthias Lorenz
◽
Junting Zhang
◽
Alexander G. Shard
◽
Jean-Luc Vorng
◽
Paulina D. Rakowska
◽
...
Keyword(s):
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Molecular Layer
◽
Ion Beam Sputtering
◽
Molecular Layer Deposition
◽
Layer Deposition
◽
Beam Sputtering
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Elastic modulus measurement of ultrathin layer using gas cluster ion beam
Journal of Advanced Mechanical Design Systems and Manufacturing
◽
10.1299/jamdsm.2021jamdsm0076
◽
2021
◽
Vol 15
(6)
◽
pp. JAMDSM0076-JAMDSM0076
Author(s):
Hiroshi TANI
◽
Renguo LU
◽
Shinji KOGANEZAWA
◽
Norio TAGAWA
Keyword(s):
Elastic Modulus
◽
Ion Beam
◽
Cluster Ion
◽
Modulus Measurement
◽
Gas Cluster Ion Beam
◽
Ultrathin Layer
Download Full-text
Double-step gas cluster ion beam smoothing
Acta Physica Sinica
◽
10.7498/aps.70.20201454
◽
2021
◽
Vol 0
(0)
◽
pp. 0-0
Author(s):
◽
Keyword(s):
Ion Beam
◽
Double Step
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Load More ...
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close