Auger Electron Spectroscopy Analysis of W diffused from WC Grain into Co Regions in Cutting Tools

Journal of Surface Analysis ◽

10.1384/jsa.21.2 ◽

2014 ◽

Vol 21 (1) ◽

pp. 2-9 ◽

Author(s):

Hiroshi Okumura ◽

Kazuhisa Mine

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Cutting Tools ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis

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Errata to “Auger Electron Spectroscopy Analysis of W diffused from WC Grain into Co Regions in Cutting Tools” [J. Surf. Anal. 21, 2-9 (2014)]

Journal of Surface Analysis ◽

10.1384/jsa.25.136 ◽

2018 ◽

Vol 25 (2) ◽

pp. 136-136

Author(s):

Hiroshi Okumura ◽

Kazuhisa Mine

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Cutting Tools ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis

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Auger Electron Spectroscopy Analysis of W Diffused from WC Grain into Co Regions Near WC/Co Interface in Cutting Tools

Hyomen Kagaku ◽

10.1380/jsssj.37.359 ◽

2016 ◽

Vol 37 (8) ◽

pp. 359-362

Author(s):

Hiroshi OKUMURA ◽

Kazuhisa MINE

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Cutting Tools ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis

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X-ray photoemission and Auger electron spectroscopy analysis of fast responding activated metal oxide silicon carbide gas sensors

Thin Solid Films ◽

10.1016/s0040-6090(96)09407-2 ◽

1997 ◽

Vol 299 (1-2) ◽

pp. 183-189 ◽

Author(s):

A Lloyd Spetz ◽

D Schmeißer ◽

A Baranzahi ◽

B Wälivaara ◽

W Göpel ◽

...

Keyword(s):

Silicon Carbide ◽

Metal Oxide ◽

Auger Electron Spectroscopy ◽

Gas Sensors ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

X Ray ◽

Metal Oxide Silicon

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Auger-electron-spectroscopy analysis of a plasmon loss in palladium silicide formed from Pd deposits on silicon

Physical Review B ◽

10.1103/physrevb.36.7422 ◽

1987 ◽

Vol 36 (14) ◽

pp. 7422-7427 ◽

Author(s):

R. Anton ◽

U. Neukirch ◽

M. Harsdorff

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

Plasmon Loss ◽

Palladium Silicide

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Beam effects in Auger electron spectroscopy analysis of titanium oxide films

Vacuum ◽

10.1016/s0042-207x(78)80693-9 ◽

1978 ◽

Vol 28 (2) ◽

pp. 104

Keyword(s):

Auger Electron Spectroscopy ◽

Titanium Oxide ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxide Films ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

Titanium Oxide Films

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Irradiation‐induced decomposition of Al2O3 during Auger electron spectroscopy analysis

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579890 ◽

1996 ◽

Vol 14 (2) ◽

pp. 286-292 ◽

Author(s):

Jae‐Won Park ◽

Anthony J. Pedraza ◽

William R. Allen

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

Induced Decomposition

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Auger electron spectroscopy analysis of oxidation states of Te in amorphous CdTe oxide thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580766 ◽

1997 ◽

Vol 15 (5) ◽

pp. 2537-2541 ◽

Author(s):

A. Zapata-Navarro ◽

P. Bartolo-Pérez ◽

M. Zapata-Torres ◽

R. Castro-Rodriguez ◽

J. L. Peña ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxidation States ◽

Oxide Thin Films ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis

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Quantitative auger electron spectroscopy analysis of AgPd and NiPd alloys

Surface Science ◽

10.1016/0039-6028(75)90126-0 ◽

1975 ◽

Vol 53 (1) ◽

pp. 228-240 ◽

Author(s):

H.J. Mathieu ◽

D. Landolt

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis

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Investigations of partial reactions during magnetron sputtering of TiN coatings by in situ Auger electron spectroscopy analysis and plasma diagnostics

Metallurgical Coatings and Thin Films 1991 ◽

10.1016/b978-0-444-89455-7.50029-0 ◽

1991 ◽

pp. 127-131

Author(s):

N. Eguchi ◽

V. Grajewski ◽

H.H. Uchida ◽

E. Fromm

Keyword(s):

Magnetron Sputtering ◽

Auger Electron Spectroscopy ◽

Plasma Diagnostics ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

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Correlation of fractional‐monolayer oxygen determinations obtained by proton‐excited x‐ray and Auger electron spectroscopy analysis of Fe surfaces

Applied Physics Letters ◽

10.1063/1.1654235 ◽

1972 ◽

Vol 21 (10) ◽

pp. 502-505 ◽

Author(s):

P.B. Needham ◽

T.J. Driscoll ◽

N.G. Rao

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

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