Notizen: Fast Pulsed Laser Induced Electron Generation for Electron Impact Mass Spectrometry
1988 ◽
Vol 43
(12)
◽
pp. 1151-1153
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Keyword(s):
Uv Laser
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A new ultra fast electron impact (El) ion source is presented that produces a very short, high intensity electron beam, allowing medium resolution mass spectra to be recorded without pulsing the ion accelerating voltages in a time-of-flight mass spectrometer (TOF-MS). The ion source requires minimum modification of any TOF-MS equipped with an electrostatic ion reflector and UV-laser. El-spectra are presented for comparison with literature spectra.
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Keyword(s):
Keyword(s):
1982 ◽
Vol 30
(5)
◽
pp. 977-982
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1984 ◽
Vol 19
(10)
◽
pp. 496-501
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1980 ◽
Vol 15
(10)
◽
pp. 502-504
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Keyword(s):
1990 ◽
Vol 27
(5)
◽
pp. 1293-1295
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Keyword(s):
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