Identification of Impurities and Defects in Semiconductors by Optical Spectroscopy

1985 ◽  
Vol 46 ◽  
Author(s):  
M. S. Skolnick

AbstractA review is given of the information that can be obtained on defect centers in semiconductors by optical spectroscopy. Particular emphasis is given to donor and acceptor identification, and symmetry determination of transition metal and axial defect-complex centers. The information that can be obtained from isotope doping effects is discussed.

1993 ◽  
Vol 90 ◽  
pp. 249-254 ◽  
Author(s):  
C Wolverton ◽  
M Asta ◽  
S Ouannasser ◽  
H Dreyssé ◽  
D de Fontaine

1983 ◽  
Vol 27 ◽  
Author(s):  
L. Salamanca-Riba ◽  
B.S. Elman ◽  
M.S. Dresselhaus ◽  
T. Venkatesan

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.


1984 ◽  
Vol 49 (3) ◽  
pp. 673-679 ◽  
Author(s):  
Pavel Lederer ◽  
Eva Mácová ◽  
Josef Vepřek-Šiška

The decomposition of peroxobenzoic acid in benzene was studied, and catalytic effects of Fe(III), Mn(III), Co(II), Co(III), and Cr(III) on the reaction rate and the composition of the reaction mixture were investigated. An analogous experiment carried out in perdeuterobenzene and determination of the distribution of deuterium in the reaction products provided evidence for the participation of the solvent in peroxobenzoic acid decomposition.


Author(s):  
Austin M. Wallace ◽  
Christine Curiac ◽  
Jared H. Delcamp ◽  
Ryan C. Fortenberry

2021 ◽  
pp. 2000118
Author(s):  
Pedro Miguel M. C. de Melo ◽  
Zeila Zanolli ◽  
Matthieu J. Verstraete

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