Investigating Central Tendency in Competency Assessment of Design Electronic Circuit: Analysis Using Many Facet Rasch Measurement (MFRM)
2017 ◽
Vol 7
(7)
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pp. 525-528
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1982 ◽
Vol 51
(11)
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pp. 3423-3430
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1975 ◽
Vol 12
(2)
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pp. 190-190
1973 ◽
Vol 9
(6)
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pp. 1685-1688
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