scholarly journals Multipass beam position, profile, and polarization measurements using intense photon target

1994 ◽  
Author(s):  
I.P. Karabekov ◽  
G.R. Neil ◽  
S. Karabekian ◽  
V. Musakhanian
Keyword(s):  
Beam Position ◽  
Polarization Measurements ◽  
Position Profile

Diamond as a tool for synchrotron radiation monitoring: beam position, profile, and temporal distribution

2000 ◽  
Vol 9 (3-6) ◽  
pp. 960-964 ◽  
Author(s):  
P. Bergonzo ◽  
A. Brambilla ◽  
D. Tromson ◽  
C. Mer ◽  
C. Hordequin ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Temporal Distribution ◽  
Radiation Monitoring ◽  
Beam Position ◽  
Position Profile

Quantitative x-ray microanalysis and thickness determination using ζ factor

1996 ◽  
Vol 54 ◽  
pp. 580-581
Author(s):  
M. Watanabe ◽  
Z. Horita ◽  
M. Nemoto
Keyword(s):  
Diffusion Couple ◽  
Extrapolation Method ◽  
Thin Specimen ◽  
Beam Position ◽  
X Ray ◽  
Thickness Determination ◽  
Experimental Limitation ◽  
X Ray Absorption

X-ray absorption in quantitative x-ray microanalysis of thin specimens may be corrected without knowledge of thickness when the extrapolation method or the differential x-ray absorption (DXA) method is used. However, there is an experimental limitation involved in each method. In this study, a method is proposed to overcome such a limitation. The method is developed by introducing the ζ factor and by combining the extrapolation method and DXA method. The method using the ζ factor, which is called the ζ-DXA method in this study, is applied to diffusion-couple experiments in the Ni-Al system.For a thin specimen where incident electrons are fully transparent, the characteristic x-ray intensity generated from a beam position, I, may be represented as I = (NρW/A)Qωaist.

Polarization measurements in raman microspectroscopy.

1989 ◽  
Vol 86 ◽  
pp. 1245-1251 ◽  
Author(s):  
Claude Bremard ◽  
Jacky Laureyns ◽  
George Turrell
Keyword(s):  
Raman Microspectroscopy ◽  
Polarization Measurements

XANES Registration by Electron Beam Position Scanning for Time-Resolved Experiment

1997 ◽  
Vol 7 (C2) ◽  
pp. C2-549-C2-552 ◽  
Author(s):  
S. G. Nikitenko ◽  
B. P. Tolochko ◽  
A. N. Aleshaev ◽  
G. N. Kulipanov ◽  
S. I. Mishnev
Keyword(s):  
Electron Beam ◽  
Time Resolved ◽  
Beam Position

POLARIZATION MEASUREMENTS OF TWO He I TRANSITIONS USING BEAM-TILTED-FOIL EXCITATION

1979 ◽  
Vol 40 (C1) ◽  
pp. C1-295-C1-297
Author(s):  
R. L. Brooks ◽  
E. H. Pinnington
Keyword(s):  
Polarization Measurements

Beam position monitoring

1979 ◽  
Author(s):  
E. Higgins
Keyword(s):  
Beam Position ◽  
Position Monitoring

Inductive megahertz beam position monitors for CEBAF

1989 ◽  
Author(s):  
W. Barry
Keyword(s):  
Beam Position ◽  
Beam Position Monitors
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