Time-of-flight detector for heavy ion backscattering spectrometry

Time of flight spectrometry in heavy ion backscattering analysis

Nuclear Instruments and Methods in Physics Research ◽

10.1016/0167-5087(83)90944-4 ◽

1983 ◽

Vol 218 (1-3) ◽

pp. 1-5 ◽

Cited By ~ 14

Author(s):

A. Chevarier ◽

N. Chevarier

Keyword(s):

Time Of Flight ◽

Heavy Ion ◽

Ion Backscattering ◽

Backscattering Analysis

Time-of-flight heavy ion backscattering spectrometry

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(94)95777-0 ◽

1994 ◽

Vol 85 (1-4) ◽

pp. 20-23 ◽

Cited By ~ 14

Author(s):

J.A. Knapp ◽

J.C. Banks ◽

B.L. Doyle

Keyword(s):

Time Of Flight ◽

Heavy Ion ◽

Ion Backscattering

Heavy ion backscattering analysis with a time-of-flight detector

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(90)90023-n ◽

1990 ◽

Vol 47 (2) ◽

pp. 148-154 ◽

Cited By ~ 28

Author(s):

M. Döbeli ◽

P.C. Haubert ◽

R.P. Livi ◽

S.J. Spicklemire ◽

D.L. Weathers ◽

...

Keyword(s):

Time Of Flight ◽

Heavy Ion ◽

Ion Backscattering ◽

Backscattering Analysis

Heavy ion energy loss straggling data from Time of Flight stopping force measurements

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2011.07.024 ◽

2012 ◽

Vol 273 ◽

pp. 6-10 ◽

Cited By ~ 9

Author(s):

M. Msimanga ◽

C.A. Pineda-Vargas ◽

C.M. Comrie ◽

S. Murray

Keyword(s):

Energy Loss ◽

Time Of Flight ◽

Heavy Ion ◽

Force Measurements ◽

Ion Energy

Time of flight assistedΔE-Emethod for enhanced isotope separation capabilities in heavy ion elastic recoil detection analysis

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2017.02.056 ◽

2017 ◽

Vol 406 ◽

pp. 10-14 ◽

Cited By ~ 1

Author(s):

S. Eschbaumer ◽

A. Bergmaier ◽

D. Seiler ◽

G. Dollinger

Keyword(s):

Isotope Separation ◽

Time Of Flight ◽

Heavy Ion ◽

Elastic Recoil ◽

Elastic Recoil Detection Analysis ◽

Elastic Recoil Detection ◽

Detection Analysis

Improved zero-time detector for heavy ion time-of-flight spectroscopy

Nuclear Instruments and Methods ◽

10.1016/0029-554x(73)90547-8 ◽

1973 ◽

Vol 108 (3) ◽

pp. 607-609 ◽

Cited By ~ 14

Author(s):

E. Dietz ◽

J.v. Czarnecki ◽

W. Patscher ◽

W. Schäfer ◽

R. Bass

Keyword(s):

Time Of Flight ◽

Heavy Ion ◽

Time Of Flight Spectroscopy ◽

Zero Time

The Dubna double-arm time-of-flight spectrometer for heavy-ion reaction products

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/0168-9002(87)90739-x ◽

1987 ◽

Vol 257 (2) ◽

pp. 197-208 ◽

Cited By ~ 6

Author(s):

K.D. Schilling ◽

P. Gippner ◽

W. Seidel ◽

F. Stary ◽

E. Will ◽

...

Keyword(s):

Time Of Flight ◽

Heavy Ion ◽

Reaction Products

Heavy ion backscattering spectrometry (HIBS) — An improved technique for trace element detection

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(89)90724-6 ◽

1989 ◽

Vol 42 (2) ◽

pp. 295-297 ◽

Cited By ~ 25

Author(s):

B.L. Doyle ◽

J.A. Knapp ◽

D.L. Buller

Keyword(s):

Trace Element ◽

Heavy Ion ◽

Improved Technique ◽

Ion Backscattering

Analysis of boron-doped amorphous silicon by means of a heavy-ion time-of-flight ERD spectrometer

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(94)95162-4 ◽

1994 ◽

Vol 89 (1-4) ◽

pp. 149-152 ◽

Cited By ~ 3

Author(s):

E. Arai ◽

A. Zounek ◽

N. Sekino ◽

K. Saito

Keyword(s):

Amorphous Silicon ◽

Time Of Flight ◽

Heavy Ion ◽

Boron Doped

Calibration of reference materials for total-reflection X-ray fluorescence analysis by heavy ion backscattering spectrometry

Spectrochimica Acta Part B Atomic Spectroscopy ◽

10.1016/s0584-8547(96)01641-2 ◽

1997 ◽

Vol 52 (7) ◽

pp. 881-886 ◽

Cited By ~ 3

Author(s):

D Werho ◽

R Gregory ◽

S Schauer ◽

X Liu ◽

G Carney ◽

...

Keyword(s):

Reference Materials ◽

Fluorescence Analysis ◽

Heavy Ion ◽

Total Reflection ◽

X Ray ◽

Ion Backscattering