scholarly journals High Corrosion Resistant Duplex Stainless Steel for Urea Plants

Materia Japan ◽  
2012 ◽  
Vol 51 (2) ◽  
pp. 67-69 ◽  
Author(s):  
Kazuhiro Ogawa ◽  
Yoshimi Yamadera ◽  
Jun-ichi Higuchi ◽  
Eiki Nagashima ◽  
Eiji Sakata
2020 ◽  
Vol 270 ◽  
pp. 127628
Author(s):  
Hongwen Yu ◽  
Xiaolong Xu ◽  
Yanli Zhang ◽  
Qian Zhang ◽  
Guangyuan Li ◽  
...  

2008 ◽  
Vol 57 (7) ◽  
pp. 322-326 ◽  
Author(s):  
Kazuhiro Suetsugu ◽  
Tooru Suzuki ◽  
Yutaka Tadokoro ◽  
Hiroshige Inoue ◽  
Ryo Matsuhashi

2009 ◽  
Vol 27 (2) ◽  
pp. 169s-173s
Author(s):  
Manabu MIZUMOTO ◽  
Hiroshige INOUE ◽  
Ryo MATSUHASHI ◽  
Yutaka TADOKORO

2018 ◽  
Vol 53 (7) ◽  
pp. 502-509 ◽  
Author(s):  
Elivelton A. Ferreira ◽  
Raone C. De C. Silva ◽  
Larissa A. T. Costa ◽  
Caroline P. R. de Oliveira ◽  
Gilmar C. Silva ◽  
...  

2021 ◽  
Vol 35 (12) ◽  
pp. 5469-5476
Author(s):  
Hussein Alrobei ◽  
Kamel Touileb ◽  
Rachid Djoudjou ◽  
Abousoufiane Ouis ◽  
Abdeljlil Chihaoui Hedhibi ◽  
...  

CORROSION ◽  
1989 ◽  
Vol 45 (9) ◽  
pp. 749-757 ◽  
Author(s):  
T. Nakayama ◽  
K. Fujiwara ◽  
Y. Torii ◽  
T. Inoue

Author(s):  
A. Redjaïmia ◽  
J.P. Morniroli ◽  
G. Metauer ◽  
M. Gantois

2D and especially 3D symmetry information required to determine the crystal structure of four intermetallic phases present as small particles (average size in the range 100-500nm) in a Fe.22Cr.5Ni.3Mo.0.03C duplex stainless steel is not present in most Convergent Beam Electron Diffraction (CBED) patterns. Nevertheless it is possible to deduce many crystal features and to identify unambiguously these four phases by means of microdiffraction patterns obtained with a nearly parallel beam focused on a very small area (50-100nm).From examinations of the whole pattern reduced (RS) and full (FS) symmetries the 7 crystal systems and the 11 Laue classes are distinguished without ambiguity (1). By considering the shifts and the periodicity differences between the ZOLZ and FOLZ reflection nets on specific Zone Axis Patterns (ZAP) which depend on the crystal system, the centering type of the cell and the glide planes are simultaneously identified (2). This identification is easily done by comparisons with the corresponding simulated diffraction patterns.


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