scholarly journals Residual Stress Analysis of Cold-drawn Pearlite Steel Wire Using White Synchrotron Radiation

2015 ◽  
Vol 55 (7) ◽  
pp. 1489-1495 ◽  
Author(s):  
Masayoshi Kumagai ◽  
Shigeo Sato ◽  
Shigeru Suzuki ◽  
Muneyuki Imafuku ◽  
Hitoshi Tashiro ◽  
...  
2008 ◽  
Vol 17 (5) ◽  
pp. 730-732 ◽  
Author(s):  
J.A. Payne ◽  
R.S. Petrova ◽  
H.J. White ◽  
A. Chauhan ◽  
J. Bai

2013 ◽  
Vol 768-769 ◽  
pp. 72-75 ◽  
Author(s):  
Peter Staron ◽  
Torben Fischer ◽  
Jozef Keckes ◽  
Sonja Schratter ◽  
Thomas Hatzenbichler ◽  
...  

A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.


2008 ◽  
Vol 571-572 ◽  
pp. 249-254 ◽  
Author(s):  
Toshihiko Sasaki ◽  
Yohei Miyazawa ◽  
Shunichi Takahashi ◽  
Ryohei Matsuyama ◽  
Katsunari Sasaki ◽  
...  

The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 2θ on stress measurement with the cosα method was investigated. The experiments were conducted under the conditions of 2θ=170 deg, 156.4 deg and 127 deg respectively. It was found that the hypothesis on the relation between the accuracy and the diffraction angle in the X-ray method is not valid in case of the cosα method.


1987 ◽  
Vol 31 ◽  
pp. 213-222
Author(s):  
Yasuo Yoshioka ◽  
Hisaaki Matsui

In the field of X-ray stress analysis, a diffraction plane at a high Bragg angle region has to be selected in order to determine the precise value of stress. But stress analysis using a most desired (hkl)- plane is not always possible. The use of synchrotron radiation (SR) enables the stress analysis using many (hkl)-planes with high accuracy by providing a perfectly monochromaticed X-ray beam having an optional wave length. Such features of SR ate most suitable for the stress analysis on materials having preferred orientation.


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