scholarly journals Measurement of Ultra Fine Defects on the Si Wafer Surface Using a Laser Light Scattering Method.

2002 ◽  
Vol 68 (10) ◽  
pp. 1337-1341 ◽  
Author(s):  
Haruyuki INOUE ◽  
Toshihiko KATAOKA ◽  
Yasushi OSHIKANE ◽  
Katsuyoshi ENDO ◽  
Yuzo MORI ◽  
...  
2001 ◽  
Vol 67 (11) ◽  
pp. 1818-1823 ◽  
Author(s):  
Satoshi SASAKI ◽  
Hiroshi AN ◽  
Yuzo MORI ◽  
Tosihiko KATAOKA ◽  
Katsuyoshi ENDO ◽  
...  

1997 ◽  
Vol 63 (8) ◽  
pp. 1117-1121 ◽  
Author(s):  
Haruyuki INOUE ◽  
Toshihiko KATAOKA ◽  
Katsuyoshi ENDO ◽  
Yasushi OSHIKANE ◽  
Yuzo MORI ◽  
...  

2002 ◽  
Vol 68 (2) ◽  
pp. 264-268
Author(s):  
Haruyuki INOUE ◽  
Toshihiko KATAOKA ◽  
Katsuyoshi ENDO ◽  
Yasushi OSHIKANE ◽  
Yuzo MORI ◽  
...  

2006 ◽  
Vol 2006 (0) ◽  
pp. 143-144
Author(s):  
Tsutom KOMOTO ◽  
Tasuku OSADA ◽  
Terunobu KUJI ◽  
Shinsaku HAGIWARA

2001 ◽  
Vol 101 (3) ◽  
pp. 109-118 ◽  
Author(s):  
Ichiro Kajiwara ◽  
Hisao Ogawa ◽  
Hirofumi Soejima ◽  
Keiji Takazoe ◽  
Shinzo Miyamoto ◽  
...  

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