Modeling IC Defects Using Circuit Simulation Software
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Abstract Often in the course of performing root cause failure analysis and fault localization, it can be helpful to have supporting information in the way of a defect model. This is particularly true when physical identification of a defect is unsuccessful. By modeling suspected, theorized, or documented defects in microchip circuitry, the analyst can more clearly show a direct link between defect and circuit failure in support of analysis conclusions.
2016 ◽
Vol 4
(2)
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pp. 102-108
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2020 ◽
pp. 225-236
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2014 ◽
Vol 7
(1)
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pp. 618-623
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2017 ◽
Vol 17
(5)
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pp. 971-978
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2016 ◽
Vol 16
(2)
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pp. 255-263