ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry
Acta Optica Sinica
◽
10.3788/aos201535.0431001
◽
2015
◽
Vol 35
(4)
◽
pp. 0431001
◽
Cited By ~ 1
Author(s):
李江 Li Jiang
◽
李沛 Li Pei
◽
黄峰 Huang Feng
◽
魏贤华 Wei Xianhua
◽
葛芳芳 Ge Fangfang
◽
...
Keyword(s):
Thin Films
◽
Spectroscopic Ellipsometry
◽
Optical Constants
◽
Accurate Determination
Download Full-text
Related Documents
Cited By
References
Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry
Acta Physica Sinica
◽
10.7498/aps.64.110702
◽
2015
◽
Vol 64
(11)
◽
pp. 110702
Author(s):
Li Jiang
◽
Tang Jing-You
◽
Pei Wang
◽
Wei Xian-Hua
◽
Huang Feng
Keyword(s):
Thin Films
◽
Spectroscopic Ellipsometry
◽
Optical Constants
◽
Accurate Determination
Download Full-text
Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach
Acta Physica Sinica
◽
10.7498/aps.59.2356
◽
2010
◽
Vol 59
(4)
◽
pp. 2356
Author(s):
Zhou Yi
◽
Wu Guo-Song
◽
Dai Wei
◽
Li Hong-Bo
◽
Wang Ai-Ying
Keyword(s):
Thin Films
◽
Optical Constants
◽
Accurate Determination
Download Full-text
Determination of Optical Constants of Thin Films in the VUV and Soft X-ray Spectral Region with Synchrotron Spectroscopic Ellipsometry
Optical Interference Coatings
◽
10.1364/oic.2007.fa6
◽
2007
◽
Author(s):
Minghong Yang
Keyword(s):
Thin Films
◽
Spectroscopic Ellipsometry
◽
Spectral Region
◽
Optical Constants
◽
X Ray
Download Full-text
Determination of optical constants of solgel-derived inhomogeneous TiO_2 thin films by spectroscopic ellipsometry and transmission spectroscopy
Applied Optics
◽
10.1364/ao.37.000691
◽
1998
◽
Vol 37
(4)
◽
pp. 691
◽
Cited By ~ 54
Author(s):
Md. Mosaddeq-ur-Rahman
◽
Guolin Yu
◽
Kalaga Murali Krishna
◽
Tetsuo Soga
◽
Junji Watanabe
◽
...
Keyword(s):
Thin Films
◽
Spectroscopic Ellipsometry
◽
Optical Constants
◽
Transmission Spectroscopy
Download Full-text
Determination of optical constants of Cd1−xZnxTe thin films by spectroscopic ellipsometry
Thin Solid Films
◽
10.1016/s0040-6090(02)00915-x
◽
2003
◽
Vol 424
(1)
◽
pp. 66-69
◽
Cited By ~ 7
Author(s):
K. Prabakar
◽
M. Sridharan
◽
Sa.K. Narayandass
◽
D. Mangalaraj
◽
Vishnu Gopal
Keyword(s):
Thin Films
◽
Spectroscopic Ellipsometry
◽
Optical Constants
Download Full-text
Accurate determination of optical constants of textured SnO2 using low incidence angle spectroscopic ellipsometry
Journal of Applied Physics
◽
10.1063/1.1797544
◽
2004
◽
Vol 96
(10)
◽
pp. 5469-5477
◽
Cited By ~ 14
Author(s):
P. D. Paulson
◽
Steven S. Hegedus
Keyword(s):
Spectroscopic Ellipsometry
◽
Optical Constants
◽
Incidence Angle
◽
Accurate Determination
◽
Low Incidence
Download Full-text
Optical constants and band gap determination of Pb0.95La0.05Zr0.54Ti0.46O3 thin films using spectroscopic ellipsometry and UV–visible spectroscopy
Optical Materials
◽
10.1016/j.optmat.2015.08.019
◽
2015
◽
Vol 49
◽
pp. 123-128
◽
Cited By ~ 21
Author(s):
Vaishali Batra
◽
Sushma Kotru
◽
M. Varagas
◽
C.V. Ramana
Keyword(s):
Thin Films
◽
Band Gap
◽
Spectroscopic Ellipsometry
◽
Optical Constants
◽
Visible Spectroscopy
◽
Uv Visible
Download Full-text
Determination of the optical constants of zinc oxide thin films by spectroscopic ellipsometry
Applied Physics Letters
◽
10.1063/1.121617
◽
1998
◽
Vol 72
(25)
◽
pp. 3261-3263
◽
Cited By ~ 150
Author(s):
P. L. Washington
◽
H. C. Ong
◽
J. Y. Dai
◽
R. P. H. Chang
Keyword(s):
Thin Films
◽
Zinc Oxide
◽
Spectroscopic Ellipsometry
◽
Optical Constants
◽
Oxide Thin Films
Download Full-text
Determination of the optical constants and film thickness of ZnTe and ZnS thin films in terms of spectrophotometric and spectroscopic ellipsometry
Ceramics International
◽
10.1016/j.ceramint.2015.10.096
◽
2016
◽
Vol 42
(2)
◽
pp. 2676-2685
◽
Cited By ~ 21
Author(s):
Deo Prakash
◽
A.M. Aboraia
◽
M. El-Hagary
◽
E.R. Shaaban
◽
K.D. Verma
Keyword(s):
Thin Films
◽
Film Thickness
◽
Spectroscopic Ellipsometry
◽
Optical Constants
Download Full-text
Accurate determination of the optical constants of absorbing thin films deposited on thick semitransparent substrates
Materials Science and Engineering B
◽
10.1016/0921-5107(89)90303-6
◽
1989
◽
Vol 5
(1)
◽
pp. 37-42
◽
Cited By ~ 5
Author(s):
G. Galibert
◽
K. Konan
◽
R. El Grandi
◽
J. Calas
◽
J.L. Martin
Keyword(s):
Thin Films
◽
Optical Constants
◽
Accurate Determination
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close