Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry
2015 ◽
Vol 64
(11)
◽
pp. 110702
Li Jiang
◽
Tang Jing-You
◽
Pei Wang
◽
Wei Xian-Hua
◽
Huang Feng
2015 ◽
Vol 35
(4)
◽
pp. 0431001
◽
李江 Li Jiang
◽
李沛 Li Pei
◽
黄峰 Huang Feng
◽
魏贤华 Wei Xianhua
◽
葛芳芳 Ge Fangfang
◽
...
2010 ◽
Vol 59
(4)
◽
pp. 2356
Zhou Yi
◽
Wu Guo-Song
◽
Dai Wei
◽
Li Hong-Bo
◽
Wang Ai-Ying
1998 ◽
Vol 37
(4)
◽
pp. 691
◽
Md. Mosaddeq-ur-Rahman
◽
Guolin Yu
◽
Kalaga Murali Krishna
◽
Tetsuo Soga
◽
Junji Watanabe
◽
...
2003 ◽
Vol 424
(1)
◽
pp. 66-69
◽
K. Prabakar
◽
M. Sridharan
◽
Sa.K. Narayandass
◽
D. Mangalaraj
◽
Vishnu Gopal
2004 ◽
Vol 96
(10)
◽
pp. 5469-5477
◽
P. D. Paulson
◽
Steven S. Hegedus
2015 ◽
Vol 49
◽
pp. 123-128
◽
Vaishali Batra
◽
Sushma Kotru
◽
M. Varagas
◽
C.V. Ramana
1998 ◽
Vol 72
(25)
◽
pp. 3261-3263
◽
P. L. Washington
◽
H. C. Ong
◽
J. Y. Dai
◽
R. P. H. Chang
2016 ◽
Vol 42
(2)
◽
pp. 2676-2685
◽
Deo Prakash
◽
A.M. Aboraia
◽
M. El-Hagary
◽
E.R. Shaaban
◽
K.D. Verma
1989 ◽
Vol 5
(1)
◽
pp. 37-42
◽
G. Galibert
◽
K. Konan
◽
R. El Grandi
◽
J. Calas
◽
J.L. Martin