Accurate determination of optical constants of textured SnO2 using low incidence angle spectroscopic ellipsometry

2004 ◽  
Vol 96 (10) ◽  
pp. 5469-5477 ◽  
Author(s):  
P. D. Paulson ◽  
Steven S. Hegedus
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Incidence Angle ◽  
Accurate Determination ◽  
Low Incidence

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

scholarly journals Accurate determination of terahertz optical constants by vector network analyzer of Fabry–Perot response

2013 ◽  
Vol 38 (24) ◽  
pp. 5438 ◽  
Author(s):  
Wenfeng Sun ◽  
Bin Yang ◽  
Xinke Wang ◽  
Yan Zhang ◽  
Robert Donnan
Keyword(s):  
Optical Constants ◽  
Accurate Determination ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Fabry Perot

Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

2001 ◽  
Vol 16 (12) ◽  
pp. 3554-3559 ◽  
Author(s):  
J. García-Serrano ◽  
N. Koshizaki ◽  
T. Sasaki ◽  
G. Martínez-Montes ◽  
U. Pal
Keyword(s):  
Film Thickness ◽  
Quartz Glass ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Composite Films ◽  
Two Phase ◽  
Glass Substrates ◽  
Optical Functions ◽  
Substrate Film

The optical constants of Si/ZnO composite films grown on quartz glass substrates were determined in the spectral range 1.5–5.0 eV by spectroscopic ellipsometry using a rotating-analyzer ellipsometer. The structure of the samples was modeled by a two-phase (substrate–film) model, and the optical functions of the film were parameterized through different effective medium approximations. The results allowed us to estimate the microstructural film parameters, such as film thickness, the volume fractions of each of the constituents, and optical constants.

scholarly journals Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach

2010 ◽  
Vol 59 (4) ◽  
pp. 2356
Author(s):  
Zhou Yi ◽  
Wu Guo-Song ◽  
Dai Wei ◽  
Li Hong-Bo ◽  
Wang Ai-Ying
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Accurate Determination
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