Planar Feature-Constrained, Quaternion-Based Registration Algorithm for LiDAR Point Clouds

2020 ◽  
Vol 40 (23) ◽  
pp. 2310001
Author(s):  
王永波 Wang Yongbo ◽  
郑南山 Zheng Nanshan ◽  
卞正富 Bian Zhengfu
2021 ◽  
Vol 10 (7) ◽  
pp. 435
Author(s):  
Yongbo Wang ◽  
Nanshan Zheng ◽  
Zhengfu Bian

Since pairwise registration is a necessary step for the seamless fusion of point clouds from neighboring stations, a closed-form solution to planar feature-based registration of LiDAR (Light Detection and Ranging) point clouds is proposed in this paper. Based on the Plücker coordinate-based representation of linear features in three-dimensional space, a quad tuple-based representation of planar features is introduced, which makes it possible to directly determine the difference between any two planar features. Dual quaternions are employed to represent spatial transformation and operations between dual quaternions and the quad tuple-based representation of planar features are given, with which an error norm is constructed. Based on L2-norm-minimization, detailed derivations of the proposed solution are explained step by step. Two experiments were designed in which simulated data and real data were both used to verify the correctness and the feasibility of the proposed solution. With the simulated data, the calculated registration results were consistent with the pre-established parameters, which verifies the correctness of the presented solution. With the real data, the calculated registration results were consistent with the results calculated by iterative methods. Conclusions can be drawn from the two experiments: (1) The proposed solution does not require any initial estimates of the unknown parameters in advance, which assures the stability and robustness of the solution; (2) Using dual quaternions to represent spatial transformation greatly reduces the additional constraints in the estimation process.


Materials ◽  
2021 ◽  
Vol 14 (6) ◽  
pp. 1563
Author(s):  
Ruibing Wu ◽  
Ziping Yu ◽  
Donghong Ding ◽  
Qinghua Lu ◽  
Zengxi Pan ◽  
...  

As promising technology with low requirements and high depositing efficiency, Wire Arc Additive Manufacturing (WAAM) can significantly reduce the repair cost and improve the formation quality of molds. To further improve the accuracy of WAAM in repairing molds, the point cloud model that expresses the spatial distribution and surface characteristics of the mold is proposed. Since the mold has a large size, it is necessary to be scanned multiple times, resulting in multiple point cloud models. The point cloud registration, such as the Iterative Closest Point (ICP) algorithm, then plays the role of merging multiple point cloud models to reconstruct a complete data model. However, using the ICP algorithm to merge large point clouds with a low-overlap area is inefficient, time-consuming, and unsatisfactory. Therefore, this paper provides the improved Offset Iterative Closest Point (OICP) algorithm, which is an online fast registration algorithm suitable for intelligent WAAM mold repair technology. The practicality and reliability of the algorithm are illustrated by the comparison results with the standard ICP algorithm and the three-coordinate measuring instrument in the Experimental Setup Section. The results are that the OICP algorithm is feasible for registrations with low overlap rates. For an overlap rate lower than 60% in our experiments, the traditional ICP algorithm failed, while the Root Mean Square (RMS) error reached 0.1 mm, and the rotation error was within 0.5 degrees, indicating the improvement of the proposed OICP algorithm.


2015 ◽  
Vol 24 (1) ◽  
pp. 013037 ◽  
Author(s):  
Jun Lu ◽  
Zhongtao Peng ◽  
Hang Su ◽  
GuiHua Xia

2014 ◽  
Vol 1 (4) ◽  
pp. 223-232 ◽  
Author(s):  
Hao Men ◽  
Kishore Pochiraju

Abstract This paper describes a variant of the extended Gaussian image based registration algorithm for point clouds with surface color information. The method correlates the distributions of surface normals for rotational alignment and grid occupancy for translational alignment with hue filters applied during the construction of surface normal histograms and occupancy grids. In this method, the size of the point cloud is reduced with a hue-based down sampling that is independent of the point sample density or local geometry. Experimental results show that use of the hue filters increases the registration speed and improves the registration accuracy. Coarse rigid transformations determined in this step enable fine alignment with dense, unfiltered point clouds or using Iterative Common Point (ICP) alignment techniques.


2018 ◽  
Vol 38 (9) ◽  
pp. 0911005
Author(s):  
王畅 Wang Chang ◽  
舒勤 Shu Qin ◽  
杨赟秀 Yang Yunxiu ◽  
陈蔚 Chen Wei

Mathematics ◽  
2021 ◽  
Vol 9 (20) ◽  
pp. 2589
Author(s):  
Artyom Makovetskii ◽  
Sergei Voronin ◽  
Vitaly Kober ◽  
Aleksei Voronin

The registration of point clouds in a three-dimensional space is an important task in many areas of computer vision, including robotics and autonomous driving. The purpose of registration is to find a rigid geometric transformation to align two point clouds. The registration problem can be affected by noise and partiality (two point clouds only have a partial overlap). The Iterative Closed Point (ICP) algorithm is a common method for solving the registration problem. Recently, artificial neural networks have begun to be used in the registration of point clouds. The drawback of ICP and other registration algorithms is the possible convergence to a local minimum. Thus, an important characteristic of a registration algorithm is the ability to avoid local minima. In this paper, we propose an ICP-type registration algorithm (λ-ICP) that uses a multiparameter functional (λ-functional). The proposed λ-ICP algorithm generalizes the NICP algorithm (normal ICP). The application of the λ-functional requires a consistent choice of the eigenvectors of the covariance matrix of two point clouds. The paper also proposes an algorithm for choosing the directions of eigenvectors. The performance of the proposed λ-ICP algorithm is compared with that of a standard point-to-point ICP and neural network Deep Closest Points (DCP).


Sign in / Sign up

Export Citation Format

Share Document